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IEC 62899-402-1:2017

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Printed electronics – Part 402-1: Printability – Measurement of qualities – Pattern width

Published By Publication Date Number of Pages
IEC 2017-03-03 16
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IEC 62899-402-1:2017(E) specifies the measurement methods of the widths of the printed patterns in printed electronics. These printed pattern widths are treated as two-dimensional on a substrate. When the patterns are definitely affected by three-dimensional configurations, these are specified in measurement methods for thickness in printed electronics.

IEC 62899-402-1:2017
$22.75