IEEE 1445 2016:2017 Edition

$50.38

IEEE Standard for Digital Test Interchange Format (DTIF)

Published By	Publication Date	Number of Pages
IEEE	2017	64

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Description

Revision Standard – Active. The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are defined. This information can be broadly grouped into data that defines the following: user under test (UUT) model, stimulus and response, fault dictionary, and probe.

PDF Catalog

PDF Pages	PDF Title
1	IEEE Std 1445™-2016 Front cover
2	Title page
4	Important Notices and Disclaimers Concerning IEEE Standards Documents
7	Participants
8	Introduction
9	Contents
11	1. Overview 1.1 Scope 1.2 Purpose 1.3 General
12	2. Normative references 3. Definitions, acronyms and abbreviations 3.1 Definitions
14	3.2 Acronyms and abbreviations
15	4. Data organization overview of the DTIF standard environment
16	4.1 UUT Model Group
17	4.2 Stimulus and response group
18	4.3 Fault Dictionary Group 4.4 Probe Group
19	5. File type specifications 5.1 HEADER file type
20	5.2 STIMULUS file type
21	5.3 PO_RESPONSE file type
22	5.4 PI_NAMES file type
23	5.5 PO_NAMES file type
24	5.6 MAIN_MODEL file type
25	5.7 COMPONENT_TYPE file type
27	5.8 USER_NODE file type
28	5.9 INPUT_PIN_NAMES file type 5.10 OUTPUT_PIN_NAMES file type
29	5.11 NEAR_FROMS_POINTERS file type 5.12 NEAR_FROMS file type
30	5.13 EVENT file type
32	5.14 SETTLED_STATE_ONLY file type 5.15 SETTLED_STATE_&_PULSES file type
34	5.16 NODE_SOURCE file type
35	5.17 STEPS file type 5.18 F.D._POPATS file type
36	5.19 F.D._FAULT_SIGNATURES file type
38	5.20 F.D._PRINT_STRINGS file type
39	5.21 TRISTATE_FROMS_POINTERS file type 5.22 TRISTATE_FROMS file type
40	5.23 PSEUDOPI_NAMES file type
41	5.24 TIMING_SETS file type
42	5.25 TIMING_PER_PATTERN file type
43	5.26 PHASE_CONNECTIONS file type
44	5.27 AUXILIARY_PIN_NAMES file type
45	5.28 PI_FORMATS file type
46	5.29 FORMAT_ATTRIBUTES file type
47	5.30 F.D._CROSS_REFERENCE file type
48	5.31 PROBETAG_DEFINITIONS file type
49	5.32 PROBETAG_ASSIGNMENTS file type
50	5.33 BURSTS file type 5.34 STIMULUS_TEXT file type
51	5.35 NODE_NAMES file type
52	5.36 EVENTS_INIT file type
53	5.37 EQUIV_FAULTS file type
54	5.38 PROBE_DETECTION file type
55	5.39 F.D._EQUIV_SETS file type 6. Conformance
56	6.1 End-to-end test (e.g., go/nogo test) 6.2 Fault dictionary diagnostics
57	6.3 Guided probe diagnostics
59	Annex A (informative) IEEE download website material associated with this document
60	Annex B (informative) Example of a circuit used in a test simulation
63	Annex C (informative) Bibliography
64	Back cover