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IEEE 2665-2022

$33.58

IEEE Recommended Practice for Statistical Process Control for EMC Test Laboratories (Approved Draft)

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IEEE 2022
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New IEEE Standard – Active. Guidance is provided on how to verify electromagnetic compatibility (EMC) test performance through the use of statistical process control (SPC) and examples of setups. Employing SPC, the validity of tests can be monitored by a laboratory by recording data in such a way that trends are detectable, and an assessment of test system stability can be made. Laboratory quality checks that use SPC are a powerful tool to provide confidence, to both the laboratory and its customer, that test results will be correct.

PDF Catalog

PDF Pages PDF Title
1 IEEE Std 2665™-2022 Front cover
2 Title page
4 Important Notices and Disclaimers Concerning IEEE Standards Documents
8 Participants
9 Introduction
10 Contents
11 1. Overview
1.1 Scope
1.2 Purpose
12 1.3 Word usage
2. Normative references
3. Definitions, acronyms, and abbreviations
3.1 Definitions
3.2 Acronyms and abbreviations
13 4. SPC Data and analysis
4.1 Measuring the independent variable
4.2 Number of individual measurements
14 4.3 Individual moving range chart
15 4.4 Calculating control limits
16 4.5 Creating the XmR chart
4.6 Control limit considerations
17 4.7 Interpreting the control chart
20 4.8 Tools to create the control chart
4.9 Frequency of data collection
21 5. SPC setups
5.1 General
5.2 SPC setup considerations
22 5.3 Radiated emissions
24 5.4 Conducted RF emissions
26 5.5 Conducted transient emissions
28 5.6 Radiated immunity
30 5.7 Bulk current injection
32 5.8 Magnetic immunity
34 5.9 Conducted transient immunity
37 5.10 Electrostatic discharge
40 Annex A (informative) Bibliography
42 Back cover
IEEE 2665-2022
$33.58