IEEE 301-1976
$30.33
IEEE Standard Test Procedures for Amplifiers and Preamplifiers for Semi- Conductor Radiation Detectors for Ionizing Radiation
| Published By | Publication Date | Number of Pages |
| IEEE | 1976 | 30 |
Revision Standard – Superseded. This standard provides standard test procedures for amplifiers and preamplifiers for semiconductor detectors for ionizing radiation. It supersedes the previous edition, IEEE Std 301-1969 (ANSI N42.2-1969). The standard has been modified and refined based on the experience gained in using the earlier edition over a six-year period and taking into account advances in the technology. Improvements in preamplifier noise characteristics and pulse shaping techniques as well as increased utilization of integral detector-preamplifier assemblies have occurred in recent years.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 7 | 1.3 Symbols and Abbreviations |
| 8 | 1 General Scope and Object 1.2 Definitions |
| 12 | 1.4 Specification Criteria Simulating Charge Pulse of a Detector Precision Pulse Generator Precision Pulse Generator Waveform |
| 13 | Preamplifier Conversion Gain Measurement of Pulse-Height Distribution Linewidth Circuit Diagram of Charge Sensitive Preamplifier |
| 14 | Preamplifier Output Pulse Decay Time Constant Definition and Measurement of Main Amplifier Gain Specifying Amplifier Noise Decay Time Constant |
| 15 | 1.10 Specifying Amplifier Nonlinearity Schematic Representation of Main Amplifier Shaping Output Signal Parameters |
| 16 | 1.11 Specifying Main Amplifier Shaping CircuitforMeasuring tw |
| 17 | 1.12 Peak Center Maximum) of the Peak 1.14 Alternative Method for Determination of FWHM and Peak Center (Centroid) Noise Linewidth Measurements Noise Measurement by Pulse Height Distribution Typical Analyzer Display for Noise Measurement |
| 19 | Noise Measurement by Oscilloscope and RMS Voltmeter Preamplifier Noise Performance 3.1 Noise as a Function of Amplifier Shaping Preamplifier Input Fixed External Capacitive Loading at Preamplifier Input |
| 20 | 3.3 Microphonics Maximum Detector Bias Voltage Main Amplifier Noise (Equivalent Noise Referred to Input) Pulse-Height Linearity Integral Nonlinearity Measurement by Bridge Method Preamplifier Input for Fixed Amplifier Peaking Time (Time Constant) |
| 21 | Measurement of Integral Nonlinearity by Bridge Method Typical Waveform of AV |
| 22 | 5.2 Differential Nonlinearity 5.3 Biased Amplifier Nonlinearity L D |
| 23 | Count RateEffects 6.1 Experimental Arrangement Signal Sources and System Parameters Measurement of Integral Nonlinearity L i for Biased Amplifier System for Measuring Integral Nonlinearity of Biased Amplifiers |
| 24 | Pulse-Height Distribution Peak Shift Spectral Resolution Versus Count Rate 7 Overload Effects 7.1 General From Counting Rate Effects |
| 25 | Amplifier Gain Recovery Time Measurement of Preamplifier Gain Recovery Time Measurement of Main Amplifier Gain Recovery Time Example of Amplifier Gain Recovery After Overloading Pulse |
| 26 | Pulse-Height Dependence on Rise Time 8.1 General Input Capacitive Loading Effects on Preamplifier Output Pulse Measurement of Capacitive Loading Effects on Preamplifier Simulation of Finite Charge-Pulse Rise Time |
| 27 | Influence of Charge Pulse Duration on Pulse Height Pulse-Height Stability 9.1 Line Voltage Variations 9.2 Temperature Effects Voltage and Current Waveforms Present in Circuit of Fig |
| 28 | 9.3 Gain Stability 10 Crossoverwalk 10.1 Crossover Walk Versus Output Amplitude 10.2 Crossover Walk Versus Gain Control Setting Measurement of Crossover Time Walk |
| 29 | 11 Bibliography |
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