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IEEE IEC 61671 2012

$151.67

IEC 61671:2012(E) (IEEE Std 1671-2010) Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

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IEEE 2012 394
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– Active. This document specifies a framework for the automatic test markup language (ATML) family of standards. ATML allows automatic test system (ATS) and test information to be exchanged in a common format adhering to the extensible markup language (XML) standard.

PDF Catalog

PDF Pages PDF Title
1 IEC 61671 (IEEE Std 1671) Front Cover
4 CONTENTS
6 IEC FOREWORD
8 Title page
10 IEEE Introduction
Notice to users
Laws and regulations
11 Copyrights
Updating of IEEE documents
Errata
Interpretations
Patents
13 Untitled
Important Notice
1. Overview
1.1 General
14 1.2 Scope
1.3 Purpose
15 1.4 Application
16 1.5 Conventions used in this document
18 2. Normative references
19 3. Definitions, acronyms, and abbreviations
3.1 Definitions
22 3.2 Acronyms and abbreviations
24 4. Automatic test system (ATS) architecture
4.1 Automatic test equipment (ATE)
27 4.2 Test program set (TPS)
30 4.3 Automatic diagnosis and testing
31 5. Automatic test markup language (ATML)
32 5.1 ATS architecture elements addressed by ATML
34 6. The ATML framework
6.1 External interfaces
35 6.2 Internal models
6.3 Services
37 7. ATML specification techniques
7.1 ATML common element partitioning
40 7.2 ATML XML schemas
7.3 XML schemas and their use in ATML
7.4 UML models
41 8. The ATML framework subdomains
8.1 The ATML framework and ATML family component standards
8.2 ATML subdomains
48 9. ATML XML schema names and locations
51 10. ATML XML schema extensibility
52 11. Conformance
11.1 ATML family XML schemas
11.2 The ATML framework
58 Annex A (normative) XML schema style guidelines
A.1 Naming conventions
60 A.2 XML declaration
A.3 ATML namespaces
62 A.4 Versioning
63 A.5 Documentation
64 A.6 Design
67 Annex B (normative) ATML common element schemas
B.1 Common element schema—Common.xsd
148 B.2 Common element schema—HardwareCommon.xsd
239 B.3 Common element schema—TestEquipment.xsd
270 Annex C (normative) ATML internal model schemas
C.1 ATML internal model schema—Capabilities.xsd
272 C.2 ATML internal model schema—WireLists.xsd
279 Annex D (normative) ATML runtime services
D.1 Messages
D.2 Executive system service
280 D.3 Example WSDL service definition
281 Annex E (informative) Pins, ports, connectors, and wire lists in ATML
E.1 Introduction
282 E.2 Overview of the base types
285 E.3 Using ports, pins, and connectors together
287 E.4 Ports, pins, and capabilities
290 E.5 Wire lists
295 Annex F (informative) ATML capabilities
F.1 Introduction
297 F.2 Overview
301 F.3 Describing instrument capabilities
340 F.4 Describing ATS capabilities
344 F.5 Capability information in ATML Test Description
351 Annex G (informative) IEEE download Web site material associated with this document
352 Annex H (informative) ATS architectures
H.1 ATS architectures utilization of published standards
355 H.2 ATS architectural relationships to IEEE SCC20-based standards
H.3 ATS architectural ATML subdomain relationship to SIMICA standards
359 Annex I (informative) Architecture examples
I.1 Instruments
360 I.2 Test descriptions
362 I.3 Complete testing scenario
375 I.4 Integrated ATML system
379 Annex J (informative) UML models
J.1 Generic ATS testing of a UUT
381 J.2 ATML XML schema relationships
384 Annex K (informative) Glossary
387 Annex L (informative) Bibliography
391 Annex M (informative) IEEE List of Participants
IEEE IEC 61671 2012
$151.67