IEEE IEC 61671 2012
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IEC 61671:2012(E) (IEEE Std 1671-2010) Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
Published By | Publication Date | Number of Pages |
IEEE | 2012 | 394 |
– Active. This document specifies a framework for the automatic test markup language (ATML) family of standards. ATML allows automatic test system (ATS) and test information to be exchanged in a common format adhering to the extensible markup language (XML) standard.
PDF Catalog
PDF Pages | PDF Title |
---|---|
1 | IEC 61671 (IEEE Std 1671) Front Cover |
4 | CONTENTS |
6 | IEC FOREWORD |
8 | Title page |
10 | IEEE Introduction Notice to users Laws and regulations |
11 | Copyrights Updating of IEEE documents Errata Interpretations Patents |
13 | Untitled Important Notice 1. Overview 1.1 General |
14 | 1.2 Scope 1.3 Purpose |
15 | 1.4 Application |
16 | 1.5 Conventions used in this document |
18 | 2. Normative references |
19 | 3. Definitions, acronyms, and abbreviations 3.1 Definitions |
22 | 3.2 Acronyms and abbreviations |
24 | 4. Automatic test system (ATS) architecture 4.1 Automatic test equipment (ATE) |
27 | 4.2 Test program set (TPS) |
30 | 4.3 Automatic diagnosis and testing |
31 | 5. Automatic test markup language (ATML) |
32 | 5.1 ATS architecture elements addressed by ATML |
34 | 6. The ATML framework 6.1 External interfaces |
35 | 6.2 Internal models 6.3 Services |
37 | 7. ATML specification techniques 7.1 ATML common element partitioning |
40 | 7.2 ATML XML schemas 7.3 XML schemas and their use in ATML 7.4 UML models |
41 | 8. The ATML framework subdomains 8.1 The ATML framework and ATML family component standards 8.2 ATML subdomains |
48 | 9. ATML XML schema names and locations |
51 | 10. ATML XML schema extensibility |
52 | 11. Conformance 11.1 ATML family XML schemas 11.2 The ATML framework |
58 | Annex A (normative) XML schema style guidelines A.1 Naming conventions |
60 | A.2 XML declaration A.3 ATML namespaces |
62 | A.4 Versioning |
63 | A.5 Documentation |
64 | A.6 Design |
67 | Annex B (normative) ATML common element schemas B.1 Common element schema—Common.xsd |
148 | B.2 Common element schema—HardwareCommon.xsd |
239 | B.3 Common element schema—TestEquipment.xsd |
270 | Annex C (normative) ATML internal model schemas C.1 ATML internal model schema—Capabilities.xsd |
272 | C.2 ATML internal model schema—WireLists.xsd |
279 | Annex D (normative) ATML runtime services D.1 Messages D.2 Executive system service |
280 | D.3 Example WSDL service definition |
281 | Annex E (informative) Pins, ports, connectors, and wire lists in ATML E.1 Introduction |
282 | E.2 Overview of the base types |
285 | E.3 Using ports, pins, and connectors together |
287 | E.4 Ports, pins, and capabilities |
290 | E.5 Wire lists |
295 | Annex F (informative) ATML capabilities F.1 Introduction |
297 | F.2 Overview |
301 | F.3 Describing instrument capabilities |
340 | F.4 Describing ATS capabilities |
344 | F.5 Capability information in ATML Test Description |
351 | Annex G (informative) IEEE download Web site material associated with this document |
352 | Annex H (informative) ATS architectures H.1 ATS architectures utilization of published standards |
355 | H.2 ATS architectural relationships to IEEE SCC20-based standards H.3 ATS architectural ATML subdomain relationship to SIMICA standards |
359 | Annex I (informative) Architecture examples I.1 Instruments |
360 | I.2 Test descriptions |
362 | I.3 Complete testing scenario |
375 | I.4 Integrated ATML system |
379 | Annex J (informative) UML models J.1 Generic ATS testing of a UUT |
381 | J.2 ATML XML schema relationships |
384 | Annex K (informative) Glossary |
387 | Annex L (informative) Bibliography |
391 | Annex M (informative) IEEE List of Participants |