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IEEE IEC 61671 5 2016

IEEE IEC 61671 5 2016

$30.33

IEC/IEEE International Standard – Standard for Automatic Test Markup Language (ATML) Test Adapter Description

Published By Publication Date Number of Pages
IEEE 2016 32
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– Active. An exchange format using extensible markup language (XML) for identifying all of the hardware, software, and documentation associated with a test adapter is specified in this document. This test adapter may be used as a component of a test program set to test and diagnose a unit under test.

PDF Catalog

PDF Pages PDF Title
3 IEC 61671-5-2016, Adoption of IEEE Std 1671.5-2015 Front Cover
4 CONTENTS
5 FOREWORD
9 Introduction
13 Important Notice
1. Overview
1.1 General
14 1.2 Application of this document’s annexes
1.3 Scope
1.4 Application
1.5 Conventions used within this document
15 2. Normative references
16 3. Definitions, acronyms, and abbreviations
3.1 Definitions
17 3.2 Acronyms and abbreviations
4. TestAdapterDescription schema
4.1 General
18 4.2 Elements
19 4.3 Simple types
5. Schema—TestAdapterInstance.xsd
5.1 General
20 5.2 Elements
21 5.3 Simple types
6. ATML TestAdapterDescription XML schema names and locations
23 7. ATML XML schema extensibility
8. Conformance
8.1 Conformance of a TestAdapterDescription instance document
24 8.2 Conformance of a TestAdapterInstance instance document
25 Annex A (informative) IEEE download website material associated with this document
26 Annex B (informative) Users information and examples
B.1 Interface test adapter
28 Annex C (informative) Glossary
29 Annex D (informative) Bibliography
30 Annex E (informative) IEEE list of Participants

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IEEE IEC 61671 5 2016
$30.33