31.080.10 - Diodes
Showing 129–144 of 144 results
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BS CECC 50008:1982
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier…
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BS EN 150001:1993:1981 Edition
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: general purpose…
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BS 9370:1983
Specification for capability approval of light emitting and infra-red diode arrays of assessed quality: generic…
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BS 9329:1977:1988 Edition
Rules for the preparation of detail specifications for semiconductor devices of assessed quality: varactor diodes…
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BS 9324:1976
Rules for the preparation of detail specifications for semiconductor devices of assessed quality: p-i-n microwave…
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BS 9323:1976:1990 Edition
Rules for the preparation of detail specifications for semiconductor devices of assessed quality: p-i-n microwave…
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BS 9307:1975:1989 Edition
Rules for the preparation of detail specifications for semiconductor devices of assessed quality: variable capacitance…
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BS 9322:1971
Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave detector…
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BS 9300 C778:1971
Detail specification for a matched pair of germanium coaxial mixer diodes Published By Publication Date…
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BS 9300 C476:1973
Detail specification for silicon avalanche rectifier diode Published By Publication Date Number of Pages BSI…
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BS EN 150006:1993:1976 Edition
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Variable capacitance…
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BS EN 62612:2013+A2:2018:2019 Edition
Self-ballasted LED lamps for general lighting services with supply voltages > 50 V. Performance requirements…
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BSI 14/30309496 DC:2014 Edition
BS EN 62612 AMD1. Self-ballasted LED lamps for general lighting services with supply voltages ≤…
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BSI DD IEC/PAS 62612:2009
Self-ballasted LED-lamps for general lighting services. Performance requirements Published By Publication Date Number of Pages…
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ASTM-F769 2000
F769-00 Standard Test Method for Measuring Transistor and Diode Leakage Currents (Withdrawn 2006) Published By…
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ASTM-F419:1994 Edition
F419-94 Test Method for Determining Carrier Density in Silicon Epitaxial Layers by Capacitance-Voltage Measurements on…