31.080 - Semiconductor devices
Showing 1073–1088 of 1120 results
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ASTM-E722 2019
E722-19 Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron…
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ASTM-F1893:2018 Edition
F1893-18 Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices Published By…
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ASTM-F1892:2018 Edition
F1892-12(2018) Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices Published By…
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ASTM-F1192:2018 Edition
F1192-11(2018) Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion…
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ASTM-F996 2018
F996-11(2018) Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components…
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ASTM-E431:2016 Edition
E431-96(2016) Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices Published By Publication…
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ASTM-E722 2014
E722-14 Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron…
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ASTM-E1161:2014 Edition
E1161-09(2014) Standard Practice for Radiologic Examination of Semiconductors and Electronic Components Published By Publication Date…
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ASTM-F1190:1999 Edition
F1190-99 Standard Guide for Neutron Irradiation of Unbiased Electronic Components Published By Publication Date Number…
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ASTM-F1190:2005 Edition
F1190-99(2005) Standard Guide for Neutron Irradiation of Unbiased Electronic Components Published By Publication Date Number…
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ASTM-F1192:2000 Edition
F1192-00 Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion…
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ASTM-F1192:2006 Edition
F1192-00(2006) Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion…
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ASTM-F1892:2004 Edition
F1892-04 Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices Published By…
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ASTM-F1892:2006 Edition
F1892-06 Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices Published By…
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ASTM-F1892:1998 Edition
F1892-98 Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices Published By…
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ASTM-F1893:2003 Edition
F1893-98(2003) Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices Published By Publication Date…