31.080 - Semiconductor devices
Showing 129–144 of 1120 results
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IEC TR 60747-5-12:2021
Semiconductor devices – Part 5-12: Optoelectronic devices – Light emitting diodes – Test method of…
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IEC PAS 62612:2009
Self-ballasted LED-lamps for general lighting services – Performance requirements Published By Publication Date Number of…
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IEC PAS 62483:2006
Test method for measuring whisker growth on tin and tin alloy surface finishes Published By…
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IEC PAS 62162:2000
Field-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components Published By…
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IEC PAS 60747-17:2011
Semiconductor devices – Discrete devices – Part 17: Magnetic and capacitive coupler for basic and…
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IEC 63287-1:2021
Dispositifs à semiconducteurs – Lignes directrices génériques concernant la qualification des semiconducteurs – Partie 1:…
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IEC 63284:2022
Semiconductor devices – Reliability test method by inductive load switching for gallium nitride transistors Published…
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IEC 63275-2:2022
Semiconductor devices – Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors…
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IEC 63275-1:2022
Semiconductor devices – Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors…
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IEC 63244-1:2021
Semiconductor devices – Semiconductor devices for wireless power transfer and charging – Part 1: General…
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IEC 63229:2021
Semiconductor devices – Classification of defects in gallium nitride epitaxial film on silicon carbide substrate…
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IEC 63150-1:2019
Semiconductor devices – Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration…
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IEC 63068-4:2022
Semiconductor devices – Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power…
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IEC 63068-3:2020
Semiconductor devices – Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power…
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IEC 63068-2:2019
Semiconductor devices – Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power…
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IEC 63068-1:2019
Semiconductor devices – Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power…