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31 - Electronics

Showing 65–80 of 4864 results

  • SAE J 2284/1:2016

    SAE J 2284/1:2016

    High Speed CAN (HSC) for Vehicle Applications at 125 kbps Published By Publication Date Number…

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  • SAE J 2284/3:2016

    SAE J 2284/3:2016

    High-Speed CAN (HSC) for Vehicle Applications at 500 kbps Published By Publication Date Number of…

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  • SAE J 2284/2:2016

    SAE J 2284/2:2016

    High Speed CAN (HSC) for Vehicle Applications at 250 kbps Published By Publication Date Number…

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  • SAE J 222:2013

    SAE J 222:2013

    Front Position Lamp Published By Publication Date Number of Pages SAE 2013-03-05 8

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  • SAE J 2221:2019

    SAE J 2221:2019

    Standardized Symbols for Electrical Circuit Diagrams Published By Publication Date Number of Pages SAE 2019-05-16…

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  • SAE J 2108:1991

    SAE J 2108:1991

    Door Courtesy Switch Published By Publication Date Number of Pages SAE 1991-12-01 4

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  • SAE J 2087:2021

    SAE J 2087:2021

    Daytime Running Lamp Published By Publication Date Number of Pages SAE 2021-02-04 8

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  • SAE J 1939/15:2018

    SAE J 1939/15:2018

    Physical Layer, 250 kbps, Un-Shielded Twisted Pair (UTP) Published By Publication Date Number of Pages…

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  • SAE J 1939/14:2016

    SAE J 1939/14:2016

    Physical Layer, 500 kbps Published By Publication Date Number of Pages SAE 2016-12-01 13

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  • SAE J 1939/11:2016

    SAE J 1939/11:2016

    Physical Layer, 250 kbps, Twisted Shielded Pair Published By Publication Date Number of Pages SAE…

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  • SAE J 1908:2013

    SAE J 1908:2013

    Electrical Grounding Practice Published By Publication Date Number of Pages SAE 2013-02-21 5

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  • SAE J 1889:2019

    SAE J 1889:2019

    Led Signal and Marking Lighting Devices Published By Publication Date Number of Pages SAE 2019-07-01…

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  • SAE J 1850:2015

    SAE J 1850:2015

    Class B Data Communications Network Interface Published By Publication Date Number of Pages SAE 2015-10-14…

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  • SAE J 1752/3:2017

    SAE J 1752/3:2017

    Measurement of Radiated Emissions from Integrated Circuits—TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz…

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  • SAE J 1752/2:2016

    SAE J 1752/2:2016

    Measurement of Radiated Emissions from Integrated Circuits—Surface Scan Method (Loop Probe Method) 10 MHz to…

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  • SAE J 1752/1:2021

    SAE J 1752/1:2021

    Electromagnetic Compatibility Measurement Procedures for Integrated Circuits – Integrated Circuit EMC Measurement Procedures – General…

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