{"id":155061,"date":"2024-10-19T09:14:17","date_gmt":"2024-10-19T09:14:17","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-iec-61671-5-2016\/"},"modified":"2024-10-25T01:29:06","modified_gmt":"2024-10-25T01:29:06","slug":"ieee-iec-61671-5-2016","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-iec-61671-5-2016\/","title":{"rendered":"IEEE IEC 61671 5 2016"},"content":{"rendered":"

– Active. An exchange format using extensible markup language (XML) for identifying all of the hardware, software, and documentation associated with a test adapter is specified in this document. This test adapter may be used as a component of a test program set to test and diagnose a unit under test.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
3<\/td>\nIEC 61671-5-2016, Adoption of IEEE Std 1671.5-2015 Front Cover <\/td>\n<\/tr>\n
4<\/td>\nCONTENTS <\/td>\n<\/tr>\n
5<\/td>\nFOREWORD <\/td>\n<\/tr>\n
9<\/td>\nIntroduction <\/td>\n<\/tr>\n
13<\/td>\nImportant Notice
1. Overview
1.1 General <\/td>\n<\/tr>\n
14<\/td>\n1.2 Application of this document\u2019s annexes
1.3 Scope
1.4 Application
1.5 Conventions used within this document <\/td>\n<\/tr>\n
15<\/td>\n2. Normative references <\/td>\n<\/tr>\n
16<\/td>\n3. Definitions, acronyms, and abbreviations
3.1 Definitions <\/td>\n<\/tr>\n
17<\/td>\n3.2 Acronyms and abbreviations
4. TestAdapterDescription schema
4.1 General <\/td>\n<\/tr>\n
18<\/td>\n4.2 Elements <\/td>\n<\/tr>\n
19<\/td>\n4.3 Simple types
5. Schema\u2014TestAdapterInstance.xsd
5.1 General <\/td>\n<\/tr>\n
20<\/td>\n5.2 Elements <\/td>\n<\/tr>\n
21<\/td>\n5.3 Simple types
6. ATML TestAdapterDescription XML schema names and locations <\/td>\n<\/tr>\n
23<\/td>\n7. ATML XML schema extensibility
8. Conformance
8.1 Conformance of a TestAdapterDescription instance document <\/td>\n<\/tr>\n
24<\/td>\n8.2 Conformance of a TestAdapterInstance instance document <\/td>\n<\/tr>\n
25<\/td>\nAnnex A (informative) IEEE download website material associated with this document <\/td>\n<\/tr>\n
26<\/td>\nAnnex B (informative) Users information and examples
B.1 Interface test adapter <\/td>\n<\/tr>\n
28<\/td>\nAnnex C (informative) Glossary <\/td>\n<\/tr>\n
29<\/td>\nAnnex D (informative) Bibliography <\/td>\n<\/tr>\n
30<\/td>\nAnnex E (informative) IEEE list of Participants <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

IEC\/IEEE International Standard – Standard for Automatic Test Markup Language (ATML) Test Adapter Description<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
IEEE<\/b><\/a><\/td>\n2016<\/td>\n32<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":155063,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2644],"product_tag":[],"class_list":{"0":"post-155061","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-ieee","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/155061","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/155063"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=155061"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=155061"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=155061"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}