{"id":194700,"date":"2024-10-19T12:21:17","date_gmt":"2024-10-19T12:21:17","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-1057-2017\/"},"modified":"2024-10-25T04:52:19","modified_gmt":"2024-10-25T04:52:19","slug":"ieee-1057-2017","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-1057-2017\/","title":{"rendered":"IEEE 1057 2017"},"content":{"rendered":"

Revision Standard – Active. Terminology and test methods for describing the performance of waveform recorders are presented in this standard.<\/p>\n

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PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
1<\/td>\nIEEE Std 1057\u2122-2017 Front cover <\/td>\n<\/tr>\n
2<\/td>\nTitle page <\/td>\n<\/tr>\n
4<\/td>\nImportant Notices and Disclaimers Concerning IEEE Standards Documents <\/td>\n<\/tr>\n
7<\/td>\nParticipants <\/td>\n<\/tr>\n
8<\/td>\nIntroduction <\/td>\n<\/tr>\n
9<\/td>\nContents <\/td>\n<\/tr>\n
12<\/td>\nList of Figures <\/td>\n<\/tr>\n
15<\/td>\nList of Tables <\/td>\n<\/tr>\n
16<\/td>\nIMPORTANT NOTICE
1.\u2002Overview
1.1\u2002Scope
1.2\u2002Waveform recorder background <\/td>\n<\/tr>\n
17<\/td>\n2.\u2002Normative references <\/td>\n<\/tr>\n
18<\/td>\n3.\u2002Definitions
3.1\u2002Definitions <\/td>\n<\/tr>\n
25<\/td>\n3.2\u2002Symbols and acronyms <\/td>\n<\/tr>\n
29<\/td>\n4.\u2002Test parameters and methods
4.1\u2002Manufacturer supplied information <\/td>\n<\/tr>\n
32<\/td>\n4.2\u2002Test selection <\/td>\n<\/tr>\n
33<\/td>\n4.3\u2002Test setup <\/td>\n<\/tr>\n
40<\/td>\n4.4\u2002Equivalent-time sampling <\/td>\n<\/tr>\n
44<\/td>\n4.5\u2002Discrete Fourier transform (DFT) <\/td>\n<\/tr>\n
53<\/td>\n4.6\u2002Sine wave testing and fitting <\/td>\n<\/tr>\n
60<\/td>\n4.7\u2002Locating code transition levels <\/td>\n<\/tr>\n
78<\/td>\n4.8\u2002Step function response measurements <\/td>\n<\/tr>\n
81<\/td>\n4.9\u2002Tests using a dc input <\/td>\n<\/tr>\n
82<\/td>\n5.\u2002Input impedance
5.1\u2002Test method
5.2\u2002Alternate test method using a time domain reflectometer (TDR)
5.3\u2002Input impedance for out-of-range signals <\/td>\n<\/tr>\n
84<\/td>\n6.\u2002Static gain and offset
6.1\u2002Independently based gain and offset <\/td>\n<\/tr>\n
86<\/td>\n6.2\u2002Terminal-based gain and offset
7.\u2002Linearity
7.1\u2002Integral nonlinearity (INL) <\/td>\n<\/tr>\n
87<\/td>\n7.2\u2002Maximum static error (MSE)
7.3\u2002Differential nonlinearity (DNL) and missing codes <\/td>\n<\/tr>\n
88<\/td>\n7.4\u2002Example INL and DNL data <\/td>\n<\/tr>\n
90<\/td>\n7.5\u2002Monotonicity <\/td>\n<\/tr>\n
91<\/td>\n7.6\u2002Hysteresis <\/td>\n<\/tr>\n
92<\/td>\n7.7\u2002Total harmonic distortion (THD) <\/td>\n<\/tr>\n
97<\/td>\n7.8\u2002Intermodulation distortion (IMD) <\/td>\n<\/tr>\n
99<\/td>\n7.9\u2002Noise power ratio (NPR) <\/td>\n<\/tr>\n
105<\/td>\n8.\u2002Noise7 <\/td>\n<\/tr>\n
106<\/td>\n8.1\u2002Comments on noise
8.2\u2002Ratio of signal to noise and distortion (SINAD) <\/td>\n<\/tr>\n
107<\/td>\n8.3\u2002Signal to noise ratio (SNR)
8.4\u2002Comments on SINAD and SNR <\/td>\n<\/tr>\n
108<\/td>\n8.5\u2002Effective number of bits (ENOB) <\/td>\n<\/tr>\n
111<\/td>\n8.6\u2002Random noise <\/td>\n<\/tr>\n
112<\/td>\n8.7\u2002Spurious components <\/td>\n<\/tr>\n
113<\/td>\n8.8\u2002Spurious-free dynamic range (SFDR) <\/td>\n<\/tr>\n
114<\/td>\n9.\u2002Step response parameters
9.1\u2002Settling parameters <\/td>\n<\/tr>\n
118<\/td>\n9.2\u2002Transition duration of the step response <\/td>\n<\/tr>\n
120<\/td>\n9.3\u2002Slew rate limit
9.4\u2002Overshoot and precursors
9.5\u2002Aperture duration <\/td>\n<\/tr>\n
125<\/td>\n9.6\u2002Limitations on the use of step responses <\/td>\n<\/tr>\n
128<\/td>\n10.\u2002Frequency response parameters
10.1\u2002Analog bandwidth
10.2\u2002Gain error (gain flatness) <\/td>\n<\/tr>\n
129<\/td>\n10.3\u2002Frequency response and gain from step response <\/td>\n<\/tr>\n
134<\/td>\n11.\u2002Interchannel parameters
11.1\u2002Crosstalk
11.2\u2002Multiple input reverse coupling <\/td>\n<\/tr>\n
135<\/td>\n12.\u2002Time base parameters
12.1\u2002Fixed error in sample time
12.2\u2002Aperture uncertainty <\/td>\n<\/tr>\n
137<\/td>\n12.3\u2002Long-term stability <\/td>\n<\/tr>\n
138<\/td>\n13.\u2002Out-of-range recovery <\/td>\n<\/tr>\n
139<\/td>\n13.1\u2002Test method for absolute out-of-range voltage recovery
13.2\u2002Test method for relative out-of-range voltage recovery
13.3\u2002Comments on test method
14.\u2002Word error rate
14.1\u2002Test method for word error rate <\/td>\n<\/tr>\n
140<\/td>\n14.2\u2002Comment on the number of samples required for word error rate
14.3\u2002Comments on test equipment and making measurements
15.\u2002Differential input specifications
15.1\u2002Differential input impedance to ground <\/td>\n<\/tr>\n
141<\/td>\n15.2\u2002Common-mode rejection ratio (CMRR) and maximum common-mode signal level
15.3\u2002Maximum operating common-mode signal <\/td>\n<\/tr>\n
142<\/td>\n15.4\u2002Common-mode out-of-range signal recovery time
16.\u2002Cycle time
16.1\u2002Test method <\/td>\n<\/tr>\n
143<\/td>\n16.2\u2002Comment
17.\u2002Triggering
17.1\u2002Trigger delay and trigger jitter <\/td>\n<\/tr>\n
144<\/td>\n17.2\u2002Trigger sensitivity <\/td>\n<\/tr>\n
145<\/td>\n17.3\u2002Trigger minimum rate of change <\/td>\n<\/tr>\n
146<\/td>\n17.4\u2002Trigger coupling to signal <\/td>\n<\/tr>\n
147<\/td>\nAnnex\u00a0A (informative) Sine fitting algorithms
A.1\u2002Algorithm for three-parameter (known frequency) least squares fit to sine wave data using matrix operations <\/td>\n<\/tr>\n
148<\/td>\nA.2\u2002Algorithm for four-parameter (general use) least squares fit to sine wave data using matrix operations <\/td>\n<\/tr>\n
151<\/td>\nAnnex\u00a0B (informative) Phase noise
B.1\u2002What is phase noise? <\/td>\n<\/tr>\n
153<\/td>\nB.2\u2002Phase noise measurements
B.3\u2002Phase noise effect on test results <\/td>\n<\/tr>\n
157<\/td>\nB.4\u2002Phase noise effects on specific tests <\/td>\n<\/tr>\n
160<\/td>\nAnnex\u00a0C (informative) Comment on errors associated with word-error-rate measurement <\/td>\n<\/tr>\n
162<\/td>\nAnnex\u00a0D (informative) Measurement of random noise below the quantization level
D.1\u20021 Derivation of equations <\/td>\n<\/tr>\n
165<\/td>\nAnnex\u00a0E (informative) Software consideration
E.1\u2002Motivation
E.2\u2002Test of software to fit waveforms
E.3\u2002Test of DFT software
E.4\u2002Software toolkit <\/td>\n<\/tr>\n
166<\/td>\nAnnex F (informative) Excitation with precision source with ramp verneir: determination of the test parameters
F.1 General
F.2 Triangular wave amplitude (A) <\/td>\n<\/tr>\n
167<\/td>\nF.3 DC source output voltages (Vj) <\/td>\n<\/tr>\n
168<\/td>\nF.4 Number of samples (K and M) and triangular wave frequency (f) <\/td>\n<\/tr>\n
169<\/td>\nAnnex\u00a0G (informative) Presentation of sine wave data
G.1\u2002General
G.2\u2002ENOB presentation <\/td>\n<\/tr>\n
170<\/td>\nG.3\u2002Presentation of residuals <\/td>\n<\/tr>\n
172<\/td>\nG.4\u2002Other examples of presentations of sine wave test results <\/td>\n<\/tr>\n
178<\/td>\nAnnex\u00a0H (informative) Bibliography <\/td>\n<\/tr>\n
181<\/td>\nBack cover <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

IEEE Standard for Digitizing Waveform Recorders<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
IEEE<\/b><\/a><\/td>\n2018<\/td>\n181<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":194704,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2644],"product_tag":[],"class_list":{"0":"post-194700","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-ieee","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/194700","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/194704"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=194700"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=194700"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=194700"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}