IEC 60440:2012 specifies a method of measurement and associated test conditions to assess the magnitude of non-linear distortion generated in a resistor. This method is applied if prescribed by a relevant component specification, or if agreed between a customer and a manufacturer. This International Standard cancels and replaces the Technical Report IEC\/TR 60440, published in 1973. The major changes with regard to the Technical Report are: – change of the principle parameter’s term from “third harmonic attenuation” to “third harmonic ratio”; – addition of advice on the prescription of requirements in a relevant component specification; – addition of a set of recommended measuring conditions for a specimen with a rated dissipation of less than 100 mW; – a complete editorial revision.<\/p>\n
| PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
|---|---|---|---|---|---|---|---|
| 6<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
| 7<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions <\/td>\n<\/tr>\n | ||||||
| 8<\/td>\n | 4 Method of measurement 4.1 Measurement principle Figures Figure 1 \u2013 Equivalent circuit at the fundamental frequency <\/td>\n<\/tr>\n | ||||||
| 9<\/td>\n | Figure 2 \u2013 Equivalent circuit at the third harmonic frequency <\/td>\n<\/tr>\n | ||||||
| 10<\/td>\n | 4.2 Measuring circuit Figure 3 \u2013 Corrective term \u0394 <\/td>\n<\/tr>\n | ||||||
| 11<\/td>\n | 4.3 Measurement system requirements 4.3.1 Measuring frequency 4.3.2 Noise level of the measuring system 4.3.3 Third harmonic ratio of the measuring system 4.3.4 Power amplifier Figure 4 \u2013 Block schematic of a suitable measuring system <\/td>\n<\/tr>\n | ||||||
| 12<\/td>\n | 4.3.5 Voltmeter 4.3.6 Filter 4.3.7 Test fixture 4.4 Verification of the measuring system 5 Measurement procedure 5.1 Environmental conditions 5.2 Preparation of specimen 5.3 Measurement conditions <\/td>\n<\/tr>\n | ||||||
| 13<\/td>\n | 5.4 Procedure 5.5 Precautions 6 Evaluation of measurement results 6.1 Evaluation <\/td>\n<\/tr>\n | ||||||
| 14<\/td>\n | 6.2 Requirements 7 Information to be given in the relevant component specification <\/td>\n<\/tr>\n | ||||||
| 15<\/td>\n | Table 1 \u2013 Recommended measuring conditions (1 of 2) <\/td>\n<\/tr>\n | ||||||
| 17<\/td>\n | Annex A (informative) Reference to IEC\/TR 60440 <\/td>\n<\/tr>\n | ||||||
| 18<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Method of measurement of non-linearity in resistors<\/b><\/p>\n |