{"id":231485,"date":"2024-10-19T15:04:43","date_gmt":"2024-10-19T15:04:43","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-iec-60384-112019\/"},"modified":"2024-10-25T09:24:36","modified_gmt":"2024-10-25T09:24:36","slug":"bs-en-iec-60384-112019","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-iec-60384-112019\/","title":{"rendered":"BS EN IEC 60384-11:2019"},"content":{"rendered":"
This part of IEC 60384 is applicable to fixed direct current capacitors, for rated voltages not exceeding 6 300 V, using as dielectric a polyethylene-terephthalate film and electrodes of thin metal foils. For capacitors with rated voltages exceeding 1 000 V, additional tests and requirements may be specified in the detail specification.<\/p>\n
The capacitors covered by this document are intended for use in electronic equipment.<\/p>\n
Capacitors for electromagnetic interference suppression are not included, but are covered by IEC 60384-14.<\/p>\n
The object of this document is to prescribe preferred ratings and characteristics and to select from IEC 60384-1:2016 the appropriate quality assessment procedures, tests and measuring methods and to give general performance requirements for this type of capacitor. Test severities and requirements prescribed in detail specifications referring to this sectional specification are of an equal or higher performance level. Lower performance levels are not permitted.<\/p>\n
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2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
5<\/td>\n | Annex ZA(normative)Normative references to international publicationswith their corresponding European publications <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 4 Preferred ratings and characteristics 4.1 Preferred climatic categories 4.2 Preferred values of ratings 4.2.1 Nominal capacitance (CN) 4.2.2 Tolerance on nominal capacitance 4.2.3 Nominal capacitance with associated tolerance values 4.2.4 Rated voltage (UR) Tables Table 1 \u2013 Preferred combinations of capacitance series and tolerance <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 4.2.5 Category voltage (UC) 4.2.6 Rated temperature 5 Test and measurement procedures, and performance requirements 5.1 Visual examination and check of dimensions 5.1.1 General 5.1.2 Examination methods 5.1.3 Requirements <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 5.2 Electrical tests 5.2.1 Voltage proof 5.2.2 Capacitance 5.2.3 Tangent of loss angle (tan \u03b4 ) Table 2 \u2013 Test voltages <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 5.2.4 Insulation resistance Table 3 \u2013 Insulation resistance <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | 5.2.5 Characteristics depending on temperature (if required in the detail specification) Table 4 \u2013 Correction factor dependent on test temperature Table 5 \u2013 Characteristics at lower category temperature Table 6 \u2013 Characteristics at upper category temperature <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | 5.3 Robustness of terminations 5.3.1 General 5.3.2 Initial inspections 5.3.3 Final inspections and requirements 5.4 Resistance to soldering heat 5.4.1 General 5.4.2 Initial inspections 5.4.3 Preconditioning 5.4.4 Test Conditions 5.4.5 Final inspections, measurements and requirements 5.5 Solderability 5.5.1 General 5.5.2 Preconditioning <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | 5.5.3 Test conditions 5.5.4 Final inspections and measurements 5.6 Rapid change of temperature 5.6.1 General 5.6.2 Initial inspections 5.6.3 Test conditions 5.6.4 Final inspections, measurements and requirements 5.7 Vibration 5.7.1 General 5.7.2 Initial inspections 5.7.3 Mounting <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | 5.7.4 Test conditions 5.7.5 Final inspections and requirements 5.8 Bump (repetitive shock) 5.8.1 General 5.8.2 Mounting 5.8.3 Initial measurements 5.8.4 Test conditions 5.8.5 Final inspection, measurements and requirements 5.9 Shock 5.9.1 General 5.9.2 Mounting <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | 5.9.3 Initial measurements 5.9.4 Test conditions 5.9.5 Final inspections, measurements and requirements 5.10 Climatic sequence 5.10.1 General 5.10.2 Initial measurements 5.10.3 Dry heat 5.10.4 Damp heat, cyclic, Test Db, first cycle 5.10.5 Cold 5.10.6 Low air pressure (if required) Table 7 \u2013 Acceleration and duration of the pulse <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | 5.10.7 Damp heat, cyclic, Test Db, remaining cycles 5.10.8 Recovery 5.10.9 Final inspections, measurements and requirements 5.11 Damp heat, steady state 5.11.1 General 5.11.2 Initial inspections 5.11.3 Test conditions <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | 5.11.4 Recovery 5.11.5 Final inspections, measurements and requirements 5.12 Endurance 5.12.1 General 5.12.2 Initial inspections 5.12.3 Test conditions 5.12.4 Final inspections, measurements and requirements 5.13 Component solvent resistance (if applicable) 5.14 Solvent resistance of the marking (if applicable) 6 Marking 6.1 General Table 8 \u2013 Endurance test <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | 6.2 Information for marking 6.3 Marking on capacitors 6.4 Marking on packaging 6.5 Additional marking 7 Information to be given in the detail specification 7.1 General 7.2 Outline drawing and dimensions <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | 7.3 Mounting 7.4 Ratings and characteristics 7.4.1 General 7.4.2 Nominal capacitance range 7.4.3 Particular characteristics 7.4.4 Soldering <\/td>\n<\/tr>\n | ||||||
26<\/td>\n | 7.5 Marking 8 Quality assessment procedures 8.1 Primary stage of manufacture 8.2 Structurally similar components 8.3 Certified records of released lots 8.4 Qualification approval 8.4.1 General 8.4.2 Qualification approval on the basis of the fixed sample size procedure <\/td>\n<\/tr>\n | ||||||
28<\/td>\n | Table 9 \u2013 Fixed sample size test plan for qualification approval assessment level EZ <\/td>\n<\/tr>\n | ||||||
29<\/td>\n | Table 10 \u2013 Test schedule for qualification approval (1 of 5) <\/td>\n<\/tr>\n | ||||||
33<\/td>\n | 8.5 Quality conformance inspection 8.5.1 Formation of inspection lots 8.5.2 Test schedule 8.5.3 Delayed delivery <\/td>\n<\/tr>\n | ||||||
34<\/td>\n | 8.5.4 Assessment levels Table 11 \u2013 Lot-by-lot inspection Table 12 \u2013 Periodic inspection <\/td>\n<\/tr>\n | ||||||
35<\/td>\n | Annex X (informative) Cross-references to the previous edition of this document Table X.1 \u2013 Cross-references <\/td>\n<\/tr>\n | ||||||
37<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Fixed capacitors for use in electronic equipment – Sectional specification. Fixed polyethylene-terephthalate film dielectric metal foil DC capacitors<\/b><\/p>\n |