{"id":343589,"date":"2024-10-20T00:07:07","date_gmt":"2024-10-20T00:07:07","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-617092011\/"},"modified":"2024-10-25T23:25:36","modified_gmt":"2024-10-25T23:25:36","slug":"bs-en-617092011","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-617092011\/","title":{"rendered":"BS EN 61709:2011"},"content":{"rendered":"

This International Standard gives guidance on how failure rate data can be employed for reliability prediction of electric components in equipment.<\/p>\n

Reference conditions are numerical values of stresses that are typically observed by components in the majority of applications. Reference conditions are useful since they are the basis of the calculation of failure rate under any conditions by the application of stress models that take into account the actual operating conditions. Failure rates stated at reference conditions allow realistic reliability predictions to be made in the early design phase.<\/p>\n

The stress models described herein are generic and can be used as a basis for conversion of the failure rate data at these reference conditions to actual operating conditions when needed and this simplifies the prediction approach. Conversion of failure rate data is only permissible within the specified functional limits of the components.<\/p>\n

This standard also gives guidance on how a database of component failure data can be constructed to provide failure rates that can be used with the included stress models. Reference conditions for failure rate data are specified, so that data from different sources can be compared on a uniform basis. If failure rate data are given in accordance with this International Standard then no additional information on the specified conditions is required.<\/p>\n

This standard does not provide base failure rates for components \u2013 rather it provides models that allow failure rates obtained by other means to be converted from one operating condition to another operating condition.<\/p>\n

The prediction methodology described in this standard assumes that the parts are being used within its useful life. The methods in this standard have a general application but are specifically applied to a selection of component types as defined in Clause 6 and Clause E.2.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
6<\/td>\nEnglish
\n
CONTENTS <\/td>\n<\/tr>\n
10<\/td>\nINTRODUCTION <\/td>\n<\/tr>\n
11<\/td>\n1 Scope
2 Normative references <\/td>\n<\/tr>\n
12<\/td>\n3 Terms, definitions and symbols
3.1 Terms and definitons <\/td>\n<\/tr>\n
14<\/td>\n3.2 Symbols <\/td>\n<\/tr>\n
15<\/td>\n4 Context and conditions
4.1 Failure modes <\/td>\n<\/tr>\n
16<\/td>\n4.2 Operating profile considerations
4.3 Storage conditions
4.4 Environmental conditions <\/td>\n<\/tr>\n
17<\/td>\nTables
\n
Table 1 \u2013 Basic environments
Table 2 \u2013 Values of environmental parameters for basic environments <\/td>\n<\/tr>\n
18<\/td>\n5 Generic reference conditions and stress models
5.1 Recommended generic reference conditions <\/td>\n<\/tr>\n
19<\/td>\n5.2 Generic stress models
Table 3 \u2013 Recommended reference conditions for environmentaland mechanical stresses <\/td>\n<\/tr>\n
22<\/td>\nTable 4 \u2013 Environmental application factor, \u03c0E
\n <\/td>\n<\/tr>\n
23<\/td>\n6 Specific reference conditions and stress models
6.1 Integrated semiconductor circuits
Table 5 \u2013 Memory <\/td>\n<\/tr>\n
24<\/td>\nTable 6 \u2013 Microprocessors and peripherals, microcontrollers and signal processors <\/td>\n<\/tr>\n
25<\/td>\nTable 8 \u2013 Analog integrated circuits (IC)
Table 9 \u2013 Application-specific ICs (ASICs) <\/td>\n<\/tr>\n
26<\/td>\nTable 10 \u2013 Constants for voltage dependence
Table 11\u2013 Factor \u03c0U
\n for digital CMOS-family ICs
Table 12 \u2013 Factor \u03c0U
\nfor bipolar analog ICs
Table 13 \u2013 Constants for temperature dependence <\/td>\n<\/tr>\n
28<\/td>\nTable 14 \u2013 Factor \u03c0T
\nfor ICs (without EPROM; FLASH-EPROM; OTPROM; EEPROM; EAROM)
Table 15 \u2013 Factor \u03c0T
\nfor EPROM, FLASH-EPROM, OTPROM, EEPROM, EAROM <\/td>\n<\/tr>\n
29<\/td>\n6.2 Discrete semiconductors
Table 16 \u2013 Transistors common, low frequency
Table 17 \u2013 Transistors, microwave, e.g. RF >800 MHz
\n <\/td>\n<\/tr>\n
30<\/td>\nTable 18 \u2013 Diodes
Table 19 \u2013 Power semiconductors <\/td>\n<\/tr>\n
31<\/td>\nTable 20 ( Constants for voltage dependence of transistors
Table 21 \u2013 Factor \u03c0U
\nfor transistors
Table 22 \u2013 Constants for temperature dependence of discrete semiconductors <\/td>\n<\/tr>\n
33<\/td>\nTable 23 \u2013 Factor \u03c0T
\nfor transistors, reference and microwave diodes
Table 24 \u2013 Factor \u03c0T
\nfor diodes (without reference and microwave diodes) and power semiconductors <\/td>\n<\/tr>\n
34<\/td>\n6.3 Optoelectronic components
Table 25 \u2013 Optoelectronic semiconductor signal receivers <\/td>\n<\/tr>\n
35<\/td>\nTable 26 \u2013 LEDs, IREDs, laser diodes and transmitter components
Table 27 \u2013 Optocouplers and light barriers <\/td>\n<\/tr>\n
36<\/td>\nTable 28 \u2013 Passive optical components
Table 29 \u2013 Transceiver, transponder and optical sub-equipment <\/td>\n<\/tr>\n
37<\/td>\nTable 30 \u2013 Constants for voltage dependence of phototransistors
Table 31 \u2013 Factor \u03c0U
\nfor phototransistors
Table 32 \u2013 Constants for current dependence of LEDs and IREDs
Table 33 \u2013 Factor \u03c0I
\n for LEDs and IREDs <\/td>\n<\/tr>\n
38<\/td>\nTable 34 \u2013 Constants for temperature dependence of optoelectronic components <\/td>\n<\/tr>\n
39<\/td>\nTable 35 \u2013 Factor \u03c0T
\n for optical components <\/td>\n<\/tr>\n
40<\/td>\n6.4 Capacitors
Table 36 \u2013 Capacitors <\/td>\n<\/tr>\n
41<\/td>\nTable 37 \u2013 Constants for voltage dependence of capacitors
Table 38 \u2013 Factor \u03c0U
\n for capacitors <\/td>\n<\/tr>\n
42<\/td>\nTable 39 \u2013 Constants for temperature dependence of capacitors <\/td>\n<\/tr>\n
43<\/td>\n6.5 Resistors and resistor networks
Table 40 \u2013 Factor \u03c0T
\nfor capacitors <\/td>\n<\/tr>\n
44<\/td>\nTable 41 \u2013 Resistors and resistor networks
Table 42 \u2013 Constants for temperature dependence of resistors <\/td>\n<\/tr>\n
45<\/td>\n6.6 Inductors, transformers and coils
Table 43 \u2013 Factor \u03c0T
\nfor resistors
Table 44 \u2013 Inductors, transformers and coils
Table 45 \u2013 Constants for temperature dependence of inductors, transformers and coils <\/td>\n<\/tr>\n
46<\/td>\n6.7 Microwave devices
Table 46 \u2013 Factor \u03c0T
\nfor inductors, transformers and coils
Table 47 \u2013 Microwave devices <\/td>\n<\/tr>\n
47<\/td>\n6.8 Other passive components
6.9 Electrical connections
Table 48 \u2013 Other passive components <\/td>\n<\/tr>\n
48<\/td>\n6.10 Connectors and sockets
6.11 Relays
Table 49 \u2013 Electrical connections
Table 50 \u2013 Connectors and sockets <\/td>\n<\/tr>\n
49<\/td>\nTable 51 \u2013 Relays <\/td>\n<\/tr>\n
50<\/td>\nFigures
\n
Figure 1 \u2013 Selection of stress regions in accordance with current and voltage-operating conditions
Table 52 \u2013 Factor \u03c0ES
\nfor low current relays
Table 53 \u2013 Factor \u03c0ES
\nfor general purpose relays <\/td>\n<\/tr>\n
51<\/td>\n6.12 Switches and push-buttons
Table 54 \u2013 Factor \u03c0ES
\nfor automotive relays
Table 55 \u2013 Constants for temperature dependence of relays
Table 56 \u2013 Facteur \u03c0T
\nfor relays <\/td>\n<\/tr>\n
52<\/td>\nFigure 2 \u2013 Selection of stress regionsin accordance with current and voltage-operating conditions
Table 57 \u2013 Switches and push-buttons <\/td>\n<\/tr>\n
53<\/td>\n6.13 Signal and pilot lamps
Table 58 \u2013 Factor \u03c0ES
\nfor switches and push-buttons for low electrical stress
Table\u00a059 \u2013 Factor \u03c0ES
\nfor switches and push-buttons for higher electrical stress
Table 60 \u2013 Signal and pilot lamps <\/td>\n<\/tr>\n
54<\/td>\nTable 61 \u2013 Factor \u03c0U
\nfor signal and pilot lamps <\/td>\n<\/tr>\n
55<\/td>\nAnnex A (normative)
\nFailure modes of components
Table A.1 \u2013 Failure modes \u2013 Integrated circuits (ICs)(digital)
Table A.2 \u2013 Failure modes \u2013 Transistors, diodes, optocouplers <\/td>\n<\/tr>\n
56<\/td>\nTable A.3 \u2013 Failure modes \u2013 Capacitors
Table A.4 \u2013 Failure modes \u2013 Resistors, inductive devices, relays <\/td>\n<\/tr>\n
57<\/td>\nAnnex B (informative)
\nFailure rate prediction <\/td>\n<\/tr>\n
61<\/td>\nFigure B.1 \u2013 Stress profile <\/td>\n<\/tr>\n
62<\/td>\nFigure B.2 \u2013 Averaging failure rates <\/td>\n<\/tr>\n
67<\/td>\nAnnex C (informative)
\nConsiderations for the design of a data base on failure rates <\/td>\n<\/tr>\n
68<\/td>\nTable C.1 \u2013 Reliability prediction database attributes <\/td>\n<\/tr>\n
70<\/td>\nAnnex D (informative)
\nPotential sources of failure rate data and methods of selection <\/td>\n<\/tr>\n
72<\/td>\nTable D.1 \u2013 Sources of reliability data (in alphabetical order) <\/td>\n<\/tr>\n
76<\/td>\nAnnex E (informative)
\nOverview of component classification <\/td>\n<\/tr>\n
77<\/td>\nTable E.1 \u2013 Classification tree (IEC\u00a061360) <\/td>\n<\/tr>\n
88<\/td>\nAnnex F (informative)
\nExamples <\/td>\n<\/tr>\n
90<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Electric components. Reliability. Reference conditions for failure rates and stress models for conversion<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2011<\/td>\n94<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":343595,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2641],"product_tag":[],"class_list":{"0":"post-343589","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-bsi","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/343589","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/343595"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=343589"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=343589"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=343589"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}