{"id":379545,"date":"2024-10-20T03:02:55","date_gmt":"2024-10-20T03:02:55","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-iec-610072020-2\/"},"modified":"2024-10-26T05:28:20","modified_gmt":"2024-10-26T05:28:20","slug":"bs-en-iec-610072020-2","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-iec-610072020-2\/","title":{"rendered":"BS EN IEC 61007:2020"},"content":{"rendered":"

IEC 61007:2020 describes a number of tests for use in determining the significant parameters and performance characteristics of transformers and inductors for use in electronics and telecommunication equipment. These test methods are designed primarily for transformers and inductors used in all types of electronics applications that can be involved in any specification for such components. Even though these tests can be useful to the other types of transformers used in power distribution applications in utilities, industry, and others, the tests discussed in this document can supplement or complement the tests but are not intended to replace the tests in standards for transformers. Some of the tests described are intended for qualifying a product for a specific application, while others are test practices used for manufacturing and customer acceptance testing. The test methods described here include those parameters most commonly used in the electronics transformer and inductor industry: electric strength, resistance, power loss, inductance, impedance, balance, transformation ratio and many others used less frequently. This edition includes the following significant technical changes with respect to the previous edition: a) scope: the application of the scope of IEC 61007 was extended; b) Clause 2: added new references and updated the references; c) Clause 3: new definitions were added in 3.3, and in 3.7 the voltage-time product was redefined; d) test procedures were updated; e) environmental test procedures: new references were added; f) Annexes A to G were added.<\/p>\n

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2<\/td>\nundefined <\/td>\n<\/tr>\n
5<\/td>\nAnnex ZA(normative)Normative references to international publicationswith their corresponding European publications <\/td>\n<\/tr>\n
7<\/td>\nEnglish
CONTENTS <\/td>\n<\/tr>\n
11<\/td>\nFOREWORD <\/td>\n<\/tr>\n
13<\/td>\n1 Scope
2 Normative references <\/td>\n<\/tr>\n
14<\/td>\n3 Terms and definitions <\/td>\n<\/tr>\n
16<\/td>\nFigures
Figure 1 \u2013 Pulse waveform parameters <\/td>\n<\/tr>\n
18<\/td>\n4 Test procedures
4.1 Test and measurement conditions
4.1.1 General <\/td>\n<\/tr>\n
19<\/td>\nTables
Table 1 \u2013 Recommended tests and specifications for specific transformer and inductor groups <\/td>\n<\/tr>\n
21<\/td>\n4.1.2 Measurement uncertainty
4.1.3 Alternative test methods
4.2 Visual inspection
4.2.1 General
4.2.2 Safety screen position
4.2.3 Quality of joints <\/td>\n<\/tr>\n
22<\/td>\nFigure 2 \u2013 Examples of good solder joints <\/td>\n<\/tr>\n
23<\/td>\nFigure 3 \u2013 Examples of defective joints <\/td>\n<\/tr>\n
24<\/td>\n4.3 Dimensioning and gauging procedure
4.4 Electrical test procedures
4.4.1 Winding resistance <\/td>\n<\/tr>\n
25<\/td>\n4.4.2 Insulation tests
Table 2 \u2013 Voltage of dielectric withstanding voltage test <\/td>\n<\/tr>\n
28<\/td>\n4.4.3 Losses <\/td>\n<\/tr>\n
29<\/td>\nFigure 4 \u2013 No-load current test schematic
Figure 5 \u2013 No-load loss test schematic <\/td>\n<\/tr>\n
31<\/td>\nFigure 6 \u2013 Simplified diagram for short-circuit power test <\/td>\n<\/tr>\n
32<\/td>\n4.4.4 Inductance
4.4.5 Unbalance <\/td>\n<\/tr>\n
33<\/td>\nFigure 7 \u2013 Circuit for measuring capacitance unbalance
Figure 8 \u2013 Circuit for determining common mode rejection ratio <\/td>\n<\/tr>\n
34<\/td>\nFigure 9 \u2013 Circuit for measuring impedance unbalance <\/td>\n<\/tr>\n
35<\/td>\nFigure 10 \u2013 Circuit for determining cross-talk attenuation <\/td>\n<\/tr>\n
37<\/td>\n4.4.6 Capacitance
Figure 11 \u2013 Schematic diagram of phase unbalance and amplitude unbalance <\/td>\n<\/tr>\n
39<\/td>\nFigure 12 \u2013 Typical graph for determining self-capacitance <\/td>\n<\/tr>\n
40<\/td>\n4.4.7 Transformation ratios
Figure 13 \u2013 Circuit for determining inter-winding capacitance <\/td>\n<\/tr>\n
43<\/td>\nFigure 14 \u2013 Circuit for measurement of voltage transformation ratio <\/td>\n<\/tr>\n
44<\/td>\nFigure 15 \u2013 Circuit for measuring current transformation ratio and phase displacement <\/td>\n<\/tr>\n
45<\/td>\nFigure 16 \u2013 Measuring circuit of current transformation ratio and phase displacement <\/td>\n<\/tr>\n
46<\/td>\n4.4.8 Resonant frequency
Figure 17 \u2013 Circuit for determining parallel self-resonant frequency <\/td>\n<\/tr>\n
47<\/td>\n4.4.9 Signal transfer characteristics
Figure 18 \u2013 Circuit for determining resonant frequency of resonant assemblies <\/td>\n<\/tr>\n
48<\/td>\nFigure 19 \u2013 Circuit for determination of insertion loss <\/td>\n<\/tr>\n
49<\/td>\nFigure 20 \u2013 Use of two identical transformers when the transformation ratio is not unity and\/or a DC bias is required <\/td>\n<\/tr>\n
50<\/td>\nFigure 21 \u2013 Illustration of return loss <\/td>\n<\/tr>\n
51<\/td>\n4.4.10 Cross-talk
Figure 22 \u2013 Basic return loss test circuit <\/td>\n<\/tr>\n
52<\/td>\n4.4.11 Frequency response
Figure 23 \u2013 Circuit diagram for measuring the crossover interference between two transformer coils <\/td>\n<\/tr>\n
53<\/td>\n4.4.12 Pulse characteristics <\/td>\n<\/tr>\n
54<\/td>\n4.4.13 Voltage-time product rating
Figure 24 \u2013 Impulse waveform measuring circuit <\/td>\n<\/tr>\n
55<\/td>\n4.4.14 Total harmonic distortion
Figure 25 \u2013 Non-linearity of magnetizing current <\/td>\n<\/tr>\n
56<\/td>\n4.4.15 Voltage regulation
Figure 26 \u2013 Voltage regulation test schematic <\/td>\n<\/tr>\n
57<\/td>\n4.4.16 Temperature rise <\/td>\n<\/tr>\n
58<\/td>\n4.4.17 Surface temperature <\/td>\n<\/tr>\n
59<\/td>\n4.4.18 Polarity
Figure 27 \u2013 Phase (polarity) test using voltage measurement <\/td>\n<\/tr>\n
60<\/td>\nFigure 28 \u2013 Series connection method <\/td>\n<\/tr>\n
61<\/td>\n4.4.19 Screens <\/td>\n<\/tr>\n
62<\/td>\n4.4.20 Noise
Table 3 \u2013 Sound-level corrections for audible noise tests <\/td>\n<\/tr>\n
63<\/td>\n4.4.21 Corona tests
4.4.22 Magnetic fields <\/td>\n<\/tr>\n
64<\/td>\nFigure 29 \u2013 Helmholtz structure <\/td>\n<\/tr>\n
65<\/td>\nTable 4 \u2013 Cube dimensions, together with corresponding search coil data <\/td>\n<\/tr>\n
66<\/td>\n4.4.23 Inrush current
4.5 Environmental test procedures
4.5.1 General
4.5.2 Soldering
4.5.3 Robustness of terminations and integral mounting devices
4.5.4 Shock <\/td>\n<\/tr>\n
67<\/td>\n4.5.5 Bump
4.5.6 Vibration (sinusoidal)
4.5.7 Acceleration, steady state
4.5.8 Rapid change of temperature (thermal shock in air)
4.5.9 Sealing
4.5.10 Climatic sequence
4.5.11 Damp heat, steady state <\/td>\n<\/tr>\n
68<\/td>\n4.5.12 Dry heat
4.5.13 Mould growth
4.5.14 Salt mist, cyclic (sodium chloride solution)
4.5.15 Sulphur dioxide test for contacts and connections
4.5.16 Fire hazard
4.5.17 Immersion in cleaning solvents
4.6 Endurance test procedures
4.6.1 Short-term endurance (load run) <\/td>\n<\/tr>\n
69<\/td>\n4.6.2 Long-term endurance (life test) <\/td>\n<\/tr>\n
70<\/td>\nAnnex A (normative)DC resistance test
A.1 General
A.2 Resistance values under 1 \u03a9 \u2013 Kelvin double-bridge method
Figure A.1 \u2013 Measurement of low resistance <\/td>\n<\/tr>\n
71<\/td>\nA.3 Resistance values from 1 \u03a9 to many kilo-ohms
A.3.1 General
A.3.2 Ammeter and voltmeter method
Figure A.2 \u2013 Kelvin double-bridge method of measuring low resistance <\/td>\n<\/tr>\n
72<\/td>\nA.3.3 Substitution method
Figure A.3 \u2013 Ammeter and voltmeter method of resistance measurement <\/td>\n<\/tr>\n
73<\/td>\nA.3.4 Wheatstone bridge
Figure A.4 \u2013 Measurement of resistance by substitution
Figure A.5 \u2013 Connections of Wheatstone bridge <\/td>\n<\/tr>\n
74<\/td>\nA.3.5 Ohmmeter
Figure A.6 \u2013 Principle of series ohmmeter <\/td>\n<\/tr>\n
75<\/td>\nA.4 Digital ohmmeter \u2013 Resistance values from under 1 \u03a9 to many kilo-ohms
Figure A.7 \u2013 Digital ohmmeter method of resistance measurement <\/td>\n<\/tr>\n
76<\/td>\nAnnex B (normative)Dielectric voltage withstand test
Figure B.1\u2013 Typical high-potential test, showing section 1 under test
Figure B.2\u2013 Typical high-potential test of inductor <\/td>\n<\/tr>\n
78<\/td>\nAnnex C (normative)Induced voltage test
C.1 Induced voltage test
C.2 General test conditions
C.3 General test methods
Figure C.1 \u2013 Block diagram of induced voltage surge test <\/td>\n<\/tr>\n
80<\/td>\nC.4 Induced excitation voltage and frequency
C.5 Repeated induced voltage testing
C.6 Excitation current <\/td>\n<\/tr>\n
81<\/td>\nAnnex D (normative)No-load loss
D.1 General
D.2 Excitation waveform
D.2.1 General
D.2.2 Sine-voltage (sine-flux) excitation <\/td>\n<\/tr>\n
82<\/td>\nD.2.3 Sine-current excitation
D.2.4 Square-wave voltage excitation <\/td>\n<\/tr>\n
83<\/td>\nD.3 Test method and instrumentation
D.3.1 General
D.3.2 Wattmeter
Figure D.1 \u2013 Triangular flux-density variation in transformer core
Figure D.2 \u2013 Test circuit for transformer no-load losses <\/td>\n<\/tr>\n
84<\/td>\nD.3.3 Ammeters
D.3.4 Voltmeters
D.4 Test specifications and results <\/td>\n<\/tr>\n
85<\/td>\nAnnex E (normative)Quality factor, Q
E.1 General
E.2 Accuracy
E.3 Generators
E.3.1 Signal generator
E.3.2 Pulse generator
E.3.3 Antenna
Figure E.1 \u2013 Damped oscillation method <\/td>\n<\/tr>\n
86<\/td>\nE.4 Capacitor
E.5 Measuring circuit
E.5.1 Oscilloscope
E.5.2 Probe
E.6 Measuring procedure <\/td>\n<\/tr>\n
87<\/td>\nE.7 Calculation
Figure E.2 \u2013 Oscilloscope sweep for damped oscillation method <\/td>\n<\/tr>\n
89<\/td>\nAnnex F (normative)Electrostatic shielding
F.1 Symbols
Figure F.1 \u2013 Shielded single winding, core floating
Figure F.2 \u2013 Basic electrostatic symbol
Figure F.3 \u2013 Multiple-shielded single winding, core terminal (lead) provided <\/td>\n<\/tr>\n
90<\/td>\nFigure F.4 \u2013 Shielded two-winding secondary, core grounded
Figure F.5 \u2013 Shielded group of windings, core floating
Figure F.6 \u2013 Multiple-shielded group of windings, core terminal (lead) provided <\/td>\n<\/tr>\n
91<\/td>\nF.2 Theoretical discussion
Figure F.7 \u2013 Combination of shielding conditions
Figure F.8 \u2013 Typical two-winding shielded transformer
Figure F.9 \u2013 Simplified representation of Figure F.8 <\/td>\n<\/tr>\n
92<\/td>\nF.3 Measurement methods
F.3.1 Indirect method
Figure F.10 \u2013 Indirect measuring method for electrostatic shielding <\/td>\n<\/tr>\n
93<\/td>\nF.3.2 Direct method <\/td>\n<\/tr>\n
94<\/td>\nAnnex G (normative)Corona test
G.1 Detection of corona
G.2 Analysis of corona
Figure G.1 \u2013 Typical circuit for corona measurement (circuit 1) <\/td>\n<\/tr>\n
95<\/td>\nG.3 Test conditions and specifications
Figure G.2 \u2013 Typical circuit for corona measurement (circuit 2) <\/td>\n<\/tr>\n
96<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Transformers and inductors for use in electronic and telecommunication equipment. Measuring methods and test procedures<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2021<\/td>\n98<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":379552,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2641],"product_tag":[],"class_list":{"0":"post-379545","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-bsi","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/379545","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/379552"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=379545"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=379545"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=379545"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}