{"id":398936,"date":"2024-10-20T04:39:40","date_gmt":"2024-10-20T04:39:40","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-592-1990\/"},"modified":"2024-10-26T08:27:15","modified_gmt":"2024-10-26T08:27:15","slug":"ieee-592-1990","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-592-1990\/","title":{"rendered":"IEEE 592-1990"},"content":{"rendered":"
Revision Standard – Inactive-Withdrawn. This standard provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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1<\/td>\n | Title page <\/td>\n<\/tr>\n | ||||||
3<\/td>\n | Introduction Participants <\/td>\n<\/tr>\n | ||||||
5<\/td>\n | CONTENTS <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | 1. Scope 2. References 3. Performance Requirements <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | 4. Test Procedures 4.1 Test Specimens 4.2 Shield Resistance Test 4.3 Fault-Current Initiation Test <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors<\/b><\/p>\n |