{"id":401382,"date":"2024-10-20T04:56:05","date_gmt":"2024-10-20T04:56:05","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-61010-0312015a12021\/"},"modified":"2024-10-26T08:43:45","modified_gmt":"2024-10-26T08:43:45","slug":"bs-en-61010-0312015a12021","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-61010-0312015a12021\/","title":{"rendered":"BS EN 61010-031:2015+A1:2021"},"content":{"rendered":"

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
2<\/td>\nundefined <\/td>\n<\/tr>\n
4<\/td>\nEuropean foreword
Endorsement notice <\/td>\n<\/tr>\n
9<\/td>\nFinal version <\/td>\n<\/tr>\n
10<\/td>\nEnglish
CONTENTS <\/td>\n<\/tr>\n
15<\/td>\nFOREWORD <\/td>\n<\/tr>\n
18<\/td>\n1 Scope and object
1.1 Scope
1.1.1 Probe assemblies included in scope <\/td>\n<\/tr>\n
19<\/td>\nFigures
Figure 1 \u2013 Examples of type A probe assemblies
Figure 2 \u2013 Examples of type B probe assemblies <\/td>\n<\/tr>\n
20<\/td>\nFigure 3 \u2013 Examples of type C probe assemblies
Figure 4 \u2013 Examples of type D probe assemblies <\/td>\n<\/tr>\n
21<\/td>\n1.1.2 Probe assemblies excluded from scope
1.2 Object
1.2.1 Aspects included in scope
1.2.2 Aspects excluded from scope
1.3 Verification
1.4 Environmental conditions
1.4.1 Normal environmental conditions
1.4.2 Extended environmental conditions <\/td>\n<\/tr>\n
22<\/td>\n2 Normative references
3 Terms and definitions
3.1 Parts and accessories <\/td>\n<\/tr>\n
23<\/td>\n3.2 Quantities
Figure 5 \u2013 Example of a stackable connector with a male connector and a female terminal <\/td>\n<\/tr>\n
24<\/td>\n3.3 Tests
3.4 Safety terms <\/td>\n<\/tr>\n
25<\/td>\n3.5 Insulation <\/td>\n<\/tr>\n
26<\/td>\n4 Tests
4.1 General <\/td>\n<\/tr>\n
27<\/td>\n4.2 Sequence of tests
4.3 Reference test conditions
4.3.1 Environmental conditions
4.3.2 State of probe assemblies
4.3.3 Position of the probe assembly <\/td>\n<\/tr>\n
28<\/td>\n4.3.4 Accessories
4.3.5 Covers and removable parts
4.3.6 Input and output voltages
4.3.7 Controls
4.3.8 Connections
4.3.9 Short-term or intermittent operation
4.4 Testing in single fault condition
4.4.1 General
4.4.2 Application of fault conditions <\/td>\n<\/tr>\n
29<\/td>\n4.4.3 Duration of tests
4.4.4 Conformity after application of fault conditions <\/td>\n<\/tr>\n
30<\/td>\n4.5 Tests in reasonably foreseeable misuse
4.5.1 General
4.5.2 Fuses
5 Marking and documentation
5.1 Marking
5.1.1 General <\/td>\n<\/tr>\n
31<\/td>\n5.1.2 Identification
5.1.3 Fuses
Tables
Table 1 \u2013 Symbols <\/td>\n<\/tr>\n
32<\/td>\n5.1.4 Connectors and operating devices
5.1.5 Rating
5.2 Warning markings
5.3 Durability of markings <\/td>\n<\/tr>\n
33<\/td>\n5.4 Documentation
5.4.1 General
5.4.2 Probe assembly rating
5.4.3 Probe assembly operation <\/td>\n<\/tr>\n
34<\/td>\n5.4.4 Probe assembly maintenance and service
6 Protection against electric shock
6.1 General <\/td>\n<\/tr>\n
35<\/td>\n6.2 Determination of accessible parts
6.2.1 General
6.2.2 Examination <\/td>\n<\/tr>\n
36<\/td>\n6.2.3 Openings for pre-set controls
6.3 Limit values for accessible parts
6.3.1 General
Figure 6 \u2013 Methods for determination of accessible parts (see 6.2)and for voltage tests of (see 6.4.2) <\/td>\n<\/tr>\n
37<\/td>\n6.3.2 Levels in normal condition
6.3.3 Levels in single fault condition <\/td>\n<\/tr>\n
38<\/td>\nFigure 7 \u2013 Capacitance level versus voltage in normal condition and single-fault condition (see 6.3.2 c) and 6.3.3 c)) <\/td>\n<\/tr>\n
39<\/td>\n6.3.4 Measurement of voltage and touch current
Figure 8 \u2013 Voltage and touch current measurement <\/td>\n<\/tr>\n
40<\/td>\nFigure 9 \u2013 Voltage and touch current measurement for the reference connector <\/td>\n<\/tr>\n
41<\/td>\nFigure 10 \u2013 Voltage and touch current measurement with shielded test probe <\/td>\n<\/tr>\n
42<\/td>\n6.4 Means of protection against electric shock
6.4.1 General
Figure 11 \u2013 Maximum test probe input voltage for 70 mA touch current <\/td>\n<\/tr>\n
43<\/td>\n6.4.2 Connectors <\/td>\n<\/tr>\n
44<\/td>\n6.4.3 Probe tips
Table 2 \u2013 Spacings for unmated connectors rated up to 1 000 V a.c. or 1 500 V d.c. with hazardous live conductive parts <\/td>\n<\/tr>\n
45<\/td>\nFigure 12 \u2013 Protection by a protective fingerguard
Figure 13 \u2013 Protection by distance <\/td>\n<\/tr>\n
46<\/td>\n6.4.4 Impedance
6.4.5 Protective impedance
Figure 14 \u2013 Protection by tactile indicator <\/td>\n<\/tr>\n
47<\/td>\n6.4.6 Basic insulation, supplementary insulation, double insulation and reinforced insulation
6.5 Insulation requirements
6.5.1 The nature of insulation <\/td>\n<\/tr>\n
48<\/td>\nTable 3 \u2013 Multiplication factors for clearances of probe assembly ratedfor operation at altitudes up to 5 000 m <\/td>\n<\/tr>\n
50<\/td>\nTable 6 \u2013 Clearances of probe assemblies rated for measurement categories <\/td>\n<\/tr>\n
51<\/td>\nTable 7 \u2013 Clearance values for the calculation of 6.5.2.3.2 <\/td>\n<\/tr>\n
52<\/td>\nFigure 18 \u2013 Example of recurring peak voltage <\/td>\n<\/tr>\n
53<\/td>\nTable 8 \u2013 Clearances for basic insulation in probe assemblies subjected to recurring peak voltages or working voltages with frequencies above 30 kHz <\/td>\n<\/tr>\n
54<\/td>\nTable 9 \u2013 Creepage distances for basic insulation or supplementary insulation <\/td>\n<\/tr>\n
55<\/td>\nTable 4 \u2013 a.c. test voltages for testing electric strength of solid insulation in probe assemblies rated for measurement categories <\/td>\n<\/tr>\n
56<\/td>\nTable 14 \u2013 Impulse test voltages for testing electric strength of solid insulation in probe assemblies rated for measurement categories <\/td>\n<\/tr>\n
57<\/td>\nFigure 15 \u2013 Distance between conductors on an interface between two layers
Figure 16 \u2013 Distance between adjacent conductors along an interface of two layers <\/td>\n<\/tr>\n
58<\/td>\nTable 5 \u2013 Minimum values for distance or thickness <\/td>\n<\/tr>\n
59<\/td>\nFigure 17 \u2013 Distance between adjacent conductors located between the same two layers <\/td>\n<\/tr>\n
60<\/td>\n6.6 Procedure for voltage tests
6.6.2 Humidity preconditioning <\/td>\n<\/tr>\n
61<\/td>\n6.6.3 Conduct of tests
6.6.4 Test voltages <\/td>\n<\/tr>\n
62<\/td>\nTable 10 \u2013 Test voltages based on clearances <\/td>\n<\/tr>\n
63<\/td>\n6.6.5 Test procedures
Table 11 \u2013 Correction factors according to test site altitudefor test voltages for clearances <\/td>\n<\/tr>\n
64<\/td>\n6.7 Constructional requirements for protection against electric shock
6.7.1 General
6.7.2 Insulating materials
6.7.3 Enclosures of probe assemblies with double insulation or reinforced insulation
6.7.4 Probe wire attachment <\/td>\n<\/tr>\n
66<\/td>\nFigure 19 \u2013 Flexing test <\/td>\n<\/tr>\n
67<\/td>\nTable 12 \u2013 Pull forces for probe wire attachment tests <\/td>\n<\/tr>\n
68<\/td>\n7 Protection against mechanical hazards
8 Resistance to mechanical stresses
8.1 General
Figure 20 \u2013 Rotational flexing test <\/td>\n<\/tr>\n
69<\/td>\n8.2 Rigidity test
8.3 Drop test
8.4 Impact swing test <\/td>\n<\/tr>\n
70<\/td>\n9 Temperature limits and protection against the spread of fire
9.1 General
Figure 21 \u2013 Impact swing test <\/td>\n<\/tr>\n
71<\/td>\n9.2 Temperature tests
10 Resistance to heat
10.1 Integrity of spacings
10.2 Resistance to heat
11 Protection against hazards from fluids
11.1 General
11.2 Cleaning <\/td>\n<\/tr>\n
72<\/td>\n11.3 Specially protected probe assemblies
12 Components
12.1 General
12.2 Fuses <\/td>\n<\/tr>\n
73<\/td>\n12.3 Probe wire
12.3.1 General
12.3.2 Rating of probe wire
12.3.3 Pressure test at high temperature for insulations <\/td>\n<\/tr>\n
74<\/td>\n12.3.4 Tests for resistance of insulation to cracking
Figure 22 \u2013 Indentation device <\/td>\n<\/tr>\n
75<\/td>\n12.3.5 Voltage test
Table 13 \u2013 Diameter of mandrel and numbers of turns <\/td>\n<\/tr>\n
76<\/td>\n12.3.6 Tensile test <\/td>\n<\/tr>\n
77<\/td>\n13 Prevention of hazard from arc flash and short-circuits
13.1 General <\/td>\n<\/tr>\n
78<\/td>\n13.2 Exposed conductive parts <\/td>\n<\/tr>\n
79<\/td>\nAnnex A (normative) Measuring circuits for touch current (see 6.3)
Figure A.1 \u2013 Measuring circuit for a.c. with frequencies up to 1 MHz and for d.c. <\/td>\n<\/tr>\n
80<\/td>\nFigure A.2 \u2013 Measuring circuits for a.c. with sinusoidal frequenciesup to 100 Hz and for d.c. <\/td>\n<\/tr>\n
81<\/td>\nFigure A.3 \u2013 Current measuring circuit for electrical burns
Figure A.4 \u2013 Current measuring circuit for high frequency test probes <\/td>\n<\/tr>\n
82<\/td>\nFigure A.5 \u2013 Current measuring circuit for wet locations <\/td>\n<\/tr>\n
83<\/td>\nAnnex B (normative) Standard test fingers
Figure B.1 \u2013 Rigid test finger <\/td>\n<\/tr>\n
84<\/td>\nFigure B.2 \u2013 Jointed test finger <\/td>\n<\/tr>\n
86<\/td>\nAnnex C (normative) Measurement of clearances and creepage distances
Table C.1 \u2013 Dimension of X <\/td>\n<\/tr>\n
88<\/td>\nAnnex D (normative) Routine spark tests on probe wire
Table D.1 \u2013 Maximum centre-to-centre spacings of bead chains <\/td>\n<\/tr>\n
89<\/td>\nFigure D.1 \u2013 Bead Chain Configuration (if applicable) <\/td>\n<\/tr>\n
90<\/td>\nTable D.2 \u2013 Formula for maximum speed of wire in terms of electrode length L of link- or bead-chain electrode <\/td>\n<\/tr>\n
92<\/td>\nAnnex E (informative) 4 mm connectors <\/td>\n<\/tr>\n
93<\/td>\nFigure E.1 \u2013 Recommended dimensions of 4 mm connectors <\/td>\n<\/tr>\n
94<\/td>\nAnnex F (normative) Measurement Categories <\/td>\n<\/tr>\n
95<\/td>\nFigure F.1 \u2013 Example to identify the locations of measurement categories
Table F.1 \u2013 Characteristics of measurement categories <\/td>\n<\/tr>\n
96<\/td>\nAnnex G Index of defined terms <\/td>\n<\/tr>\n
97<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Safety requirements for electrical equipment for measurement, control and laboratory use – Safety requirements for hand-held and hand-manipulated probe assemblies for electrical test and measurement<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2022<\/td>\n98<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":401392,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[155,2641],"product_tag":[],"class_list":{"0":"post-401382","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-11-080-10","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/401382","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/401392"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=401382"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=401382"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=401382"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}