| PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
|---|---|---|---|---|---|---|---|
| 7<\/td>\n | Foreword <\/td>\n<\/tr>\n | ||||||
| 9<\/td>\n | 0 Introduction 1 Scope <\/td>\n<\/tr>\n | ||||||
| 10<\/td>\n | 2 Normative references <\/td>\n<\/tr>\n | ||||||
| 11<\/td>\n | 3 Terms, definitions and symbols <\/td>\n<\/tr>\n | ||||||
| 17<\/td>\n | 4 Classification <\/td>\n<\/tr>\n | ||||||
| 18<\/td>\n | 4.1 Classification according to behaviour resulting from failure of the line voltage 4.2 Classification according to the design 4.3 Classification according to behaviour in presence of d.c. components 4.4 Classification according to the provision for earthing 4.5 Classification according to the design of the cover plate 4.6 Classification according to the method of mounting <\/td>\n<\/tr>\n | ||||||
| 19<\/td>\n | 4.7 Classification according to the environmental conditions 4.8 Classification according to the type of terminals 4.9 Classification according to overcurrent protection 4.10 Type of SRCD 4.11 Number of poles <\/td>\n<\/tr>\n | ||||||
| 20<\/td>\n | 4.12 Type of switching 5 Characteristics of SRCDs 5.1 Summary of characteristics 5.2 Characteristics common to all socket\u2011outlet residual current devices <\/td>\n<\/tr>\n | ||||||
| 21<\/td>\n | 5.3 Characteristics specific to SRCDs with overcurrent protection (see 4.9) <\/td>\n<\/tr>\n | ||||||
| 22<\/td>\n | 5.4 Preferred or standard values <\/td>\n<\/tr>\n | ||||||
| 23<\/td>\n | Table 1 \u2014 Standard values of maximum break time of SRCDs for a.c. residual current Table 2 \u2014 Standard values of maximum break time of SRCDs for pulsating d.c. residual current 5.5 Text deleted 6 Marking and other product information 6.1 General Table 4 \u2014 Position of marking <\/td>\n<\/tr>\n | ||||||
| 26<\/td>\n | 6.2 Additional marking for screwless terminals 6.3 Void 7 Standard conditions for operation in service and for installation Table 5 \u2014 Values of influencing quantities <\/td>\n<\/tr>\n | ||||||
| 27<\/td>\n | 8 Requirements for construction and operation 8.1 General 8.2 Information and marking <\/td>\n<\/tr>\n | ||||||
| 28<\/td>\n | 8.3 Mechanical and electrical design <\/td>\n<\/tr>\n | ||||||
| 29<\/td>\n | Table 6 \u2014 Minimum clearances and creepage distances <\/td>\n<\/tr>\n | ||||||
| 32<\/td>\n | 8.4 Operating characteristics <\/td>\n<\/tr>\n | ||||||
| 33<\/td>\n | Table 7 \u2014 Tripping current limits 8.5 Void 8.6 Test device 8.7 Temperature rise <\/td>\n<\/tr>\n | ||||||
| 34<\/td>\n | Table 8 \u2014 Temperature\u2011rise values 8.8 Resistance to humidity 8.9 Dielectric properties 8.10 EMC compliance and unwanted tripping 8.11 Behaviour of SRCDs in case of overcurrent conditions <\/td>\n<\/tr>\n | ||||||
| 35<\/td>\n | 8.12 Resistance of the insulation against impulse voltages 8.13 Mechanical and electrical endurance 8.14 Resistance to mechanical shock 8.15 Reliability 8.16 Protection against electric shock and degree of protection IP of the SRCD <\/td>\n<\/tr>\n | ||||||
| 36<\/td>\n | 8.17 Resistance to heat 8.18 Resistance to abnormal heat and to fire 8.19 Behaviour of SRCDs within ambient temperature range <\/td>\n<\/tr>\n | ||||||
| 37<\/td>\n | 8.20 Resistance to temporary overvoltages Table 11 \u2014 Withstand values and duration of temporary overvoltages 9 Tests 9.1 General Table 12 \u2014 Test copper conductors corresponding to the rated currents <\/td>\n<\/tr>\n | ||||||
| 38<\/td>\n | Table 13 \u2014 Type testing schedule 9.2 Marking and test of indelibility of marking 9.3 Verification of the trip\u2011free mechanism <\/td>\n<\/tr>\n | ||||||
| 39<\/td>\n | 9.4 Test for the verification of electronic circuits <\/td>\n<\/tr>\n | ||||||
| 40<\/td>\n | Table 14 \u2014 Maximum permissible temperatures under abnormal conditions <\/td>\n<\/tr>\n | ||||||
| 41<\/td>\n | 9.5 Requirements for capacitors and specific resistors and inductors <\/td>\n<\/tr>\n | ||||||
| 42<\/td>\n | 9.6 Test of reliability of screws, current\u2011carrying parts and connections Table 15 \u2014 Screw thread diameters and applied torques 9.7 Screwed and screwless terminals <\/td>\n<\/tr>\n | ||||||
| 43<\/td>\n | Table 16 \u2014 Relationship between rated current and connectable nominal cross\u2011sectional areas of copper conductors <\/td>\n<\/tr>\n | ||||||
| 44<\/td>\n | Table 17 \u2014 Values for flexing under mechanical load test for copper conductors <\/td>\n<\/tr>\n | ||||||
| 45<\/td>\n | Table 18 \u2014 Values for pull test for screw\u2011type terminals Table 19 \u2014 Composition of conductors <\/td>\n<\/tr>\n | ||||||
| 46<\/td>\n | Table 20 \u2014 Tightening torques for the verification of the mechanical strength of screw\u2011type terminals <\/td>\n<\/tr>\n | ||||||
| 48<\/td>\n | Table 21 \u2014 Relationship between rated current and connectable cross\u2011sectional areas of copper conductors for screwless terminals <\/td>\n<\/tr>\n | ||||||
| 49<\/td>\n | Table 22 \u2014 Value for pull test for screwless\u2011type terminals <\/td>\n<\/tr>\n | ||||||
| 50<\/td>\n | Table 23 \u2014 Values for flexing under mechanical load test for copper conductors Table 24 \u2014 Test current for the verification of electrical and thermal stresses in normal use for screwless terminals <\/td>\n<\/tr>\n | ||||||
| 52<\/td>\n | Table 25 \u2014 Nominal cross\u2011sectional areas of rigid copper conductors for deflection test of screwless terminals Table 26 \u2014 Deflection test forces <\/td>\n<\/tr>\n | ||||||
| 53<\/td>\n | 9.8 Verification of the operating characteristics of type AC and type A SRCDs <\/td>\n<\/tr>\n | ||||||
| 56<\/td>\n | Table 27 \u2014 Tripping current ranges for SRCDs in case of pulsating d.c. current <\/td>\n<\/tr>\n | ||||||
| 57<\/td>\n | 9.9 Void 9.10 Verification of the test device 9.11 Verification of the limit of temperature rise <\/td>\n<\/tr>\n | ||||||
| 59<\/td>\n | Table 27A \u2014 Loading of SRCDs for temperature rise test <\/td>\n<\/tr>\n | ||||||
| 60<\/td>\n | 9.12 Resistance to humidity <\/td>\n<\/tr>\n | ||||||
| 61<\/td>\n | 9.13 Test of dielectric properties <\/td>\n<\/tr>\n | ||||||
| 62<\/td>\n | 9.14 EMC compliance and unwanted tripping Table 28 \u2014 Tests to be applied for EMC <\/td>\n<\/tr>\n | ||||||
| 63<\/td>\n | 9.15 Verification of the behaviour of the SRCD under overcurrent conditions Table 29 \u2014 Tests to verify the behaviour of SRCDs under overcurrent conditions <\/td>\n<\/tr>\n | ||||||
| 66<\/td>\n | Table 30 \u2014 Power factor ranges of the test circuit <\/td>\n<\/tr>\n | ||||||
| 70<\/td>\n | 9.16 Verification of clearances of the SRCD with the impulse withstand voltage test <\/td>\n<\/tr>\n | ||||||
| 71<\/td>\n | Table 31 \u2014 Test voltage for verification of impulse withstand voltage between poles Table 32 \u2014 Test voltage for verification of impulse withstand voltage with the metal support 9.17 Mechanical and electrical endurance <\/td>\n<\/tr>\n | ||||||
| 72<\/td>\n | Table 33 \u2014 Cross\u2011sectional area for test conductors <\/td>\n<\/tr>\n | ||||||
| 73<\/td>\n | 9.18 Resistance to mechanical shock <\/td>\n<\/tr>\n | ||||||
| 74<\/td>\n | Table 34 \u2014 Height of fall for impact tests <\/td>\n<\/tr>\n | ||||||
| 76<\/td>\n | Table 35 \u2014 Torque test values for glands <\/td>\n<\/tr>\n | ||||||
| 77<\/td>\n | 9.19 Reliability <\/td>\n<\/tr>\n | ||||||
| 79<\/td>\n | 9.20 Protection against electric shock and degree of protection IP of the SRCD <\/td>\n<\/tr>\n | ||||||
| 80<\/td>\n | 9.21 Resistance to heat <\/td>\n<\/tr>\n | ||||||
| 81<\/td>\n | 9.22 Resistance to abnormal heat and to fire \u2013 Glow\u2011wire test <\/td>\n<\/tr>\n | ||||||
| 82<\/td>\n | 9.23 Text deleted 9.24 Verification of ageing of electronic components 9.25 Verification of the behaviour of the SRCD under temporary overvoltage conditions <\/td>\n<\/tr>\n | ||||||
| 83<\/td>\n | 9.26 Tests for reverse polarity (see 8.3.1) 9.27 Resistance to excessive residual stress test <\/td>\n<\/tr>\n | ||||||
| 84<\/td>\n | Figure 1 \u2014 Standard test finger <\/td>\n<\/tr>\n | ||||||
| 85<\/td>\n | Figure 2 \u2014 General test circuit <\/td>\n<\/tr>\n | ||||||
| 86<\/td>\n | Figure 3 \u2014 Minimum creepage distances and clearances as a function of peak value of voltage <\/td>\n<\/tr>\n | ||||||
| 87<\/td>\n | Figure 4 \u2014 Minimum creepage distances and clearances as a function of peak value of operating voltage <\/td>\n<\/tr>\n | ||||||
| 88<\/td>\n | Figure 5 \u2014 Pillar terminals <\/td>\n<\/tr>\n | ||||||
| 89<\/td>\n | Figure 6 \u2014 Screw terminals and stud terminals <\/td>\n<\/tr>\n | ||||||
| 90<\/td>\n | Figure 7 \u2014 Saddle terminals <\/td>\n<\/tr>\n | ||||||
| 91<\/td>\n | Figure 8 \u2014 Saddle terminals <\/td>\n<\/tr>\n | ||||||
| 92<\/td>\n | Figure 9 \u2014 Arrangement for checking damage to conductors <\/td>\n<\/tr>\n | ||||||
| 93<\/td>\n | Figure 10 \u2014 Information for deflection test <\/td>\n<\/tr>\n | ||||||
| 94<\/td>\n | Figure 11 \u2014 Example of a test circuit with current and voltage derived from separate sources Figure 12 \u2014 Test cycle for low temperature test <\/td>\n<\/tr>\n | ||||||
| 95<\/td>\n | Figure 13 \u2014 Void Figure 14 \u2014 Test circuit for the verification of the correct operation of SRCDs, in the case of residual pulsating direct currents <\/td>\n<\/tr>\n | ||||||
| 96<\/td>\n | Figure 15 \u2014 Test circuit for the verification of the correct operation of SRCDs, in the case of residual pulsating direct currents superimposed by a smooth direct current <\/td>\n<\/tr>\n | ||||||
| 97<\/td>\n | Figure 16 \u2014 Damped oscillator current wave 0,5 \u03bcs\/100 kHz Figure 17 \u2014 Example of test circuit for the verification of resistance against unwanted tripping due to surge currents to earth resulting from impulse voltages for SRCDs <\/td>\n<\/tr>\n | ||||||
| 98<\/td>\n | Figure 18 \u2014 Test circuit for the verification of the rated making and breaking capacity and of the coordination <\/td>\n<\/tr>\n | ||||||
| 99<\/td>\n | Figure 19 \u2014 Test apparatus for the verification of the minimum I2t and Ip values to be withstood by the SRCD [9.15.2.1a)] <\/td>\n<\/tr>\n | ||||||
| 100<\/td>\n | Figure 20 \u2014 Gauge for checking non\u2011accessibility of live parts <\/td>\n<\/tr>\n | ||||||
| 101<\/td>\n | Figure 21 \u2014 Impact\u2011test apparatus <\/td>\n<\/tr>\n | ||||||
| 102<\/td>\n | Figure 22 \u2014 Details of the striking element <\/td>\n<\/tr>\n | ||||||
| 103<\/td>\n | Figure 23 \u2014 Mounting support for specimens Figure 24 \u2014 Mounting block for flush\u2011type SRCDs <\/td>\n<\/tr>\n | ||||||
| 104<\/td>\n | Figure 25 \u2014 Reliability test cycle <\/td>\n<\/tr>\n | ||||||
| 105<\/td>\n | Figure 26 \u2014 Ball\u2011pressure test apparatus <\/td>\n<\/tr>\n | ||||||
| 106<\/td>\n | Figure 27 \u2014 Sketches and table showing the application of the blows <\/td>\n<\/tr>\n | ||||||
| 107<\/td>\n | Figure 28 \u2014 Diagrammatic representation of 9.22 Figure 29 \u2014 Test circuit for the verification of TOV withstand (9.25) A) <\/td>\n<\/tr>\n | ||||||
| 108<\/td>\n | Annex A (normative)\u2002 Test sequence and number of samples to be submitted for verification of conformity Table A.1 \u2014 Type testing schedule <\/td>\n<\/tr>\n | ||||||
| 110<\/td>\n | Table A.2 \u2014 Number of samples for full test procedure <\/td>\n<\/tr>\n | ||||||
| 111<\/td>\n | Table A.3 \u2014 Number of samples for simplified test procedure <\/td>\n<\/tr>\n | ||||||
| 112<\/td>\n | Annex B (normative)\u2002 Determination of clearances and creepage distances <\/td>\n<\/tr>\n | ||||||
| 113<\/td>\n | Figures B.1 to B.10 \u2014 Illustrations of the application of creepage distances <\/td>\n<\/tr>\n | ||||||
| 114<\/td>\n | Annex C (informative)\u2002 Text deleted Annex D (normative)\u2002 Routine tests <\/td>\n<\/tr>\n | ||||||
| 115<\/td>\n | Annex E (informative)\u2002 Methods of determination of short\u2011circuit power factor <\/td>\n<\/tr>\n | ||||||
| 116<\/td>\n | Annex F (informative)\u2002 Differences between BS 7822:2016 and IEC 62640:2011 (with the common modifications) Table F.1 \u2014 Differences between BS 7288:2016 and IEC 62640:2011\/HD 62640:2015 <\/td>\n<\/tr>\n | ||||||
| 119<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Specification for residual current devices with or without overcurrent protection for socket\u2011outlets for household and similar uses<\/b><\/p>\n |