{"id":41277,"date":"2024-10-17T06:07:41","date_gmt":"2024-10-17T06:07:41","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/astm-e668-2005\/"},"modified":"2024-10-24T15:31:55","modified_gmt":"2024-10-24T15:31:55","slug":"astm-e668-2005","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/astm\/astm-e668-2005\/","title":{"rendered":"ASTM-E668 2005"},"content":{"rendered":"<\/p>\n

1.1 This practice covers procedures for the use of thermoluminescence dosimeters (TLDs) to determine the absorbed dose in a material irradiated by ionizing radiation. Although some elements of the procedures have broader application, the specific area of concern is radiation-hardness testing of electronic devices. This practice is applicable to the measurement of absorbed dose in materials irradiated by gamma rays, X rays, and electrons of energies from 12 to 60 MeV. Specific energy limits are covered in appropriate sections describing specific applications of the procedures. The range of absorbed dose covered is approximately from 10 2<\/sup> to 10 4<\/sup> Gy (1 to 10 6<\/sup> rad), and the range of absorbed dose rates is approximately from 10 2<\/sup> to 10 10<\/sup> Gy\/s (1 to 10 12<\/sup> rad\/s). Absorbed dose and absorbed dose-rate measurements in materials subjected to neutron irradiation are not covered in this practice. Further, the portion of these procedures that deal with electron irradiation are primarily intended for use in parts testing. Testing of devices as a part of more massive components such as electronics boards or boxes may require techniques outside the scope of this practice.<\/p>\n

Note 1The purpose of the upper and lower limits on the energy for electron irradiation is to approach a limiting case where dosimetry is simplified. Specifically, the dosimetry methodology specified requires that the following three limiting conditions be approached: ( a<\/i> ) energy loss of the primary electrons is small, ( b<\/i> ) secondary electrons are largely stopped within the dosimeter, and ( c<\/i> ) bremsstrahlung radiation generated by the primary electrons is largely lost.<\/p>\n

1.2 This standard dose not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.<\/i><\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
1<\/td>\nScope
Referenced Documents
Terminology <\/td>\n<\/tr>\n
2<\/td>\nSignificance and Use
Apparatus <\/td>\n<\/tr>\n
3<\/td>\nHandling and Readout Procedures
Summary of Requirements for Performance Testing of a TLD System <\/td>\n<\/tr>\n
4<\/td>\nSpecific Performance Tests and Correction Factors <\/td>\n<\/tr>\n
7<\/td>\nCalibration of the TLD System <\/td>\n<\/tr>\n
8<\/td>\nProcedures for Characterizing and Monitoring a Test Radiation Field and for Determining Dose in a Device Under Test Using TLD Systems
TABLE 1 <\/td>\n<\/tr>\n
12<\/td>\nReport
Keywords <\/td>\n<\/tr>\n
13<\/td>\nX1. DETERMINATION OF ELECTRON EQUILIBRIUM THICKNESS (PHOTON IRRADIATIONS)
X1.1
X1.2
X1.3
X1.4 <\/td>\n<\/tr>\n
14<\/td>\nX2. RECOMMENDED PROCEDURES FOR APPLICATION OF CaF2:Mn CHIPS
X2.1 Scope
X2.2 Dosimeter Preparation
X2.3 Effects of Storage and Transportation
FIG. X1.1 <\/td>\n<\/tr>\n
15<\/td>\nX2.4 Irradiation Procedures
X2.5 Readout
X2.6 Precision and Bias
TABLE X2.1
TABLE X2.2 <\/td>\n<\/tr>\n
16<\/td>\nX3. DETERMINATION OF TEST SAMPLE SIZE
X3.1
X3.2
FIG. X3.1 <\/td>\n<\/tr>\n
17<\/td>\nX3.3
X4. ENERGY ABSORPTION COEFFICIENTS AND COLLISION STOPPING POWERS
X4.1
TABLE X4.1 <\/td>\n<\/tr>\n
18<\/td>\nX5. SELECTED ELECTRON-PHOTON TRANSPORT CODES
X5.1
X5.2 Availability of codes
X5.3 Bibliography for the CEPXS\/ONELD code:
FIG. X4.1
FIG. X4.2
X5.4 Bibliography for the ITS Code System: <\/td>\n<\/tr>\n
19<\/td>\nREFERENCES <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

E668-05 Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
ASTM<\/b><\/a><\/td>\n2005<\/td>\n19<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":41278,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2637],"product_tag":[],"class_list":{"0":"post-41277","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-astm","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/41277","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/41278"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=41277"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=41277"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=41277"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}