{"id":416972,"date":"2024-10-20T06:13:39","date_gmt":"2024-10-20T06:13:39","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-61375-3-22012-2\/"},"modified":"2024-10-26T11:34:32","modified_gmt":"2024-10-26T11:34:32","slug":"bs-en-61375-3-22012-2","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-61375-3-22012-2\/","title":{"rendered":"BS EN 61375-3-2:2012"},"content":{"rendered":"
This part of IEC 61375 applies to all equipment and devices implemented according to IEC 61375-3-1, i.e. it covers the procedures to be applied to such equipment and devices when the conformance should be proven.<\/p>\n
The applicability of this standard to a TCN implementation allows for individual conformance checking of the implementation itself and is a pre-requisite for further interoperability checking between different TCN implementations.<\/p>\n
\nNOTE 1 An example of TCN implementation is given in UIC 556.<\/p>\n<\/blockquote>\n
PDF Catalog<\/h4>\n
\n
\n PDF Pages<\/th>\n PDF Title<\/th>\n<\/tr>\n \n 7<\/td>\n English
CONTENTS <\/td>\n<\/tr>\n\n 10<\/td>\n INTRODUCTION
Tables
Table 1 \u2013 Document structure <\/td>\n<\/tr>\n\n 11<\/td>\n 1 Scope
2 Normative references <\/td>\n<\/tr>\n\n 12<\/td>\n 3 Terms and definitions
4 Conformance test: approach, requirements and boundaries
4.1 Approach
4.1.1 Requirements <\/td>\n<\/tr>\n\n 14<\/td>\n 4.1.2 Requirements declaration statements for an IUT <\/td>\n<\/tr>\n \n 15<\/td>\n 4.2 Boundaries
4.2.1 General <\/td>\n<\/tr>\n\n 16<\/td>\n 4.2.3 Capability tests
4.2.2 Basic interconnection tests <\/td>\n<\/tr>\n\n 17<\/td>\n 4.2.4 Behaviour tests
4.2.5 Conformance resolution tests <\/td>\n<\/tr>\n\n 18<\/td>\n 4.2.6 Interpretation of clauses\/subclauses and statements <\/td>\n<\/tr>\n \n 19<\/td>\n Table 2 \u2013 Continuance indication <\/td>\n<\/tr>\n \n 20<\/td>\n 4.2.7 Relation to interoperability
4.2.8 Relation to performance test
Table 3 \u2013 Weak statements
Table 4 \u2013 Relation to interoperability
Table 5 \u2013 Relation to performance test <\/td>\n<\/tr>\n\n 21<\/td>\n 4.3 Conformance assessment process outline
4.3.1 General
4.3.2 Analysis of results, outcomes and verdicts <\/td>\n<\/tr>\n\n 22<\/td>\n 5 Conformance test of an\u00a0MVB device
5.1 PICS
5.1.1 Instructions for filling the PICS pro-forma <\/td>\n<\/tr>\n\n 24<\/td>\n 5.1.2 PICS tables <\/td>\n<\/tr>\n \n 32<\/td>\n 5.2 Test suites
5.2.1 Basic interconnection tests
Figures
Figure 1 \u2013 Application of the waveshaper <\/td>\n<\/tr>\n\n 33<\/td>\n 5.2.2 Capability tests
Table 6 \u2013 ESD basic interconnection tests
Table 7 \u2013 EMD basic interconnection tests <\/td>\n<\/tr>\n\n 34<\/td>\n 5.2.3 Behavioural tests
5.2.4 Electrical short distance medium
Figure 2 \u2013 ESD test layout <\/td>\n<\/tr>\n\n 35<\/td>\n Table 8 \u2013 Measurement idle
Table 9 \u2013 Measurement with load for minimum current
Table 10 \u2013 Measurement with load for maximum current <\/td>\n<\/tr>\n\n 36<\/td>\n Figure 3 \u2013 ESD terminator connector test
Table 11 \u2013 Measurement with load for overcurrent
Table 12 \u2013 ESD measurements pin to pin <\/td>\n<\/tr>\n\n 37<\/td>\n Figure 4 \u2013 ESD waveform measurement <\/td>\n<\/tr>\n \n 38<\/td>\n 5.2.5 Electrical middle distance medium <\/td>\n<\/tr>\n \n 39<\/td>\n Figure 5 \u2013 Measurement of an EMD device <\/td>\n<\/tr>\n \n 40<\/td>\n Figure 6 \u2013 Measurement of insertion loss <\/td>\n<\/tr>\n \n 41<\/td>\n Figure 7 \u2013 EMD transmitter test circuits <\/td>\n<\/tr>\n \n 43<\/td>\n 5.2.6 Slave device status test suites <\/td>\n<\/tr>\n \n 51<\/td>\n 5.2.7 Process data test suites <\/td>\n<\/tr>\n \n 52<\/td>\n Figure 8 \u2013 Example of test hardware implementation <\/td>\n<\/tr>\n \n 57<\/td>\n Figure 9 \u2013 F_code + Address <\/td>\n<\/tr>\n \n 63<\/td>\n 5.2.8 Slave message data capability test suite
Figure 10 \u2013 Concept of message data testing <\/td>\n<\/tr>\n\n 64<\/td>\n Figure\u00a011 \u2013 Model of the relation between TE and IUT for message data testing
Figure 12 \u2013 Relation between TE and IUT in case of test of IUT as caller <\/td>\n<\/tr>\n\n 65<\/td>\n Figure 13 \u2013 Packet formats (transport layer body) <\/td>\n<\/tr>\n \n 66<\/td>\n Figure 14 \u2013 Test message task of IUT <\/td>\n<\/tr>\n \n 67<\/td>\n Table\u00a013 \u2013 Event poll strategy <\/td>\n<\/tr>\n \n 69<\/td>\n Figure 15 \u2013 Caller timeout identification <\/td>\n<\/tr>\n \n 71<\/td>\n Table 14 \u2013 Abbreviations
Table\u00a015 \u2013 Addressing type <\/td>\n<\/tr>\n\n 73<\/td>\n Table 16 \u2013 Test function directory <\/td>\n<\/tr>\n \n 74<\/td>\n Figure 16 \u2013 Nesting address with 0x83
Table 17 \u2013 Test station directory <\/td>\n<\/tr>\n\n 75<\/td>\n Table 18 \u2013 Nesting address <\/td>\n<\/tr>\n \n 76<\/td>\n Table 19 \u2013 Read_Memory and Write_Memory sequence <\/td>\n<\/tr>\n \n 80<\/td>\n 5.2.9 MVB repeater conformance tests
Figure 17 \u2013 Block diagram of a line <\/td>\n<\/tr>\n\n 81<\/td>\n Figure 18 \u2013 Frames in test RP-1.2 <\/td>\n<\/tr>\n \n 82<\/td>\n Figure 19 \u2013 Inter-frame spacing <\/td>\n<\/tr>\n \n 83<\/td>\n Figure 20 \u2013 Pulse distortion
Figure 21 \u2013 Frame with out-of-place transition <\/td>\n<\/tr>\n\n 84<\/td>\n Figure 22 \u2013 Frames in test RP-1.4 <\/td>\n<\/tr>\n \n 87<\/td>\n Table 20 \u2013 Configuration of periodic data in BA
Table 21 \u2013 Configuration of periodic ports in CU-1 <\/td>\n<\/tr>\n\n 88<\/td>\n Table 22 \u2013 Configuration of periodic ports in CU-2 <\/td>\n<\/tr>\n \n 89<\/td>\n 6 Conformance test of RTP
6.1 General
6.2 Ports and Traffic_Store
6.3 Dataset consistency <\/td>\n<\/tr>\n\n 90<\/td>\n 6.3.1 Error handling
6.3.2 Freshness supervision
6.3.3 Synchronisation dataset
6.3.4 Dataset polling
6.3.5 Dataset, port and logical address
6.3.6 Traffic_Store Identifier <\/td>\n<\/tr>\n\n 91<\/td>\n 6.4 Port_Address
6.5 Link_Process_Data_Interface primitives
6.6 Messages services and protocols
7 Conformance test of NM <\/td>\n<\/tr>\n\n 92<\/td>\n Annex A (normative) Test laboratory role and client role <\/td>\n<\/tr>\n \n 99<\/td>\n Annex B (informative) Test instrumentation and dedicated test beds
Figure B.1 \u2013 Test bed configuration MRTB1 <\/td>\n<\/tr>\n\n 100<\/td>\n Figure B.2 \u2013 Test bed configuration MRTB2 <\/td>\n<\/tr>\n \n 101<\/td>\n Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Electronic railway equipment. Train communication network (TCN) – MVB (Multifunction Vehicle Bus) conformance testing<\/b><\/p>\n
\n\n
\n Published By<\/td>\n Publication Date<\/td>\n Number of Pages<\/td>\n<\/tr>\n \n BSI<\/b><\/a><\/td>\n 2012<\/td>\n 104<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":416981,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[775,2641],"product_tag":[],"class_list":{"0":"post-416972","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-45-060-01","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/416972","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/416981"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=416972"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=416972"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=416972"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}