| PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
|---|---|---|---|---|---|---|---|
| 2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
| 4<\/td>\n | European foreword Endorsement notice <\/td>\n<\/tr>\n | ||||||
| 5<\/td>\n | Annex ZA (normative) Normative references to international publications with their corresponding European publications <\/td>\n<\/tr>\n | ||||||
| 6<\/td>\n | Blank Page <\/td>\n<\/tr>\n | ||||||
| 7<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
| 10<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
| 12<\/td>\n | 1 Scope 2 Normative references <\/td>\n<\/tr>\n | ||||||
| 13<\/td>\n | 3 Terms and definitions 4 Preferred ratings and characteristics 4.1 Preferred climatic categories 4.2 Preferred values of ratings 4.2.1 Nominal capacitance (CN) <\/td>\n<\/tr>\n | ||||||
| 14<\/td>\n | 4.2.2 Tolerance on nominal capacitance 4.2.3 Rated voltage (UR) 4.2.4 Category voltage (UC) 4.2.5 Rated temperature Tables Table 1 \u2013 Percentage limit of the rated voltage at AC voltage frequency <\/td>\n<\/tr>\n | ||||||
| 15<\/td>\n | 5 Test and measurement procedures 5.1 General 5.2 Mounting 5.2.1 Initial inspections 5.2.2 Mounting method 5.2.3 Final inspections after mounting 5.3 Visual examination and check of dimensions 5.3.1 General 5.3.2 Visual examination and check of dimensions 5.3.3 Requirements 5.4 Electrical tests 5.4.1 Voltage proof <\/td>\n<\/tr>\n | ||||||
| 16<\/td>\n | 5.4.2 Capacitance 5.4.3 Tangent of loss angle (tan \u03b4) Table 2 \u2013 Test voltages <\/td>\n<\/tr>\n | ||||||
| 17<\/td>\n | 5.4.4 Insulation resistance Table 3 \u2013 Tangent of loss angle limits <\/td>\n<\/tr>\n | ||||||
| 18<\/td>\n | 5.5 Shear test 5.5.1 General 5.5.2 Final inspections Table 4 \u2013 Requirements regarding insulation resistance Table 5 \u2013 Correction factor dependent on temperature <\/td>\n<\/tr>\n | ||||||
| 19<\/td>\n | 5.6 Substrate bending test 5.6.1 General 5.6.2 Initial inspections 5.6.3 Final inspections and requirements 5.7 Resistance to soldering heat 5.7.1 General 5.7.2 Initial inspections 5.7.3 Test conditions 5.7.4 Recovery 5.7.5 Final inspections and requirements 5.8 Solderability 5.8.1 General <\/td>\n<\/tr>\n | ||||||
| 20<\/td>\n | 5.8.2 Test conditions 5.8.3 Final inspections and requirements 5.9 Rapid change of temperature 5.9.1 General 5.9.2 Initial inspections 5.9.3 Test conditions 5.9.4 Final inspections and requirements 5.10 Climatic sequence 5.10.1 General 5.10.2 Initial inspections 5.10.3 Dry heat <\/td>\n<\/tr>\n | ||||||
| 21<\/td>\n | 5.10.4 Damp heat, cyclic, test Db, first cycle 5.10.5 Cold 5.10.6 Damp heat, cyclic, test Db, remaining cycles 5.10.7 Recovery 5.10.8 Final inspections and requirements 5.11 Damp heat, steady state 5.11.1 General 5.11.2 Initial inspections 5.11.3 Test conditions 5.11.4 Recovery 5.11.5 Final inspections and requirements <\/td>\n<\/tr>\n | ||||||
| 22<\/td>\n | 5.12 Endurance 5.12.1 General 5.12.2 Initial inspections 5.12.3 Test conditions 5.12.4 Final inspections and requirements 5.13 Charge and discharge 5.13.1 General Table 6 \u2013 Endurance test conditions for Grade 1 and Grade 2 capacitors Table 7 \u2013 Endurance test conditions for Grade 3 capacitors <\/td>\n<\/tr>\n | ||||||
| 23<\/td>\n | 5.13.2 Initial inspections 5.13.3 Test conditions 5.13.4 Recovery 5.13.5 Final inspections and requirements 5.14 Component solvent resistance (if required) 5.14.1 General 5.14.2 Final inspections and requirements 5.15 Solvent resistance of marking (if applicable) 5.15.1 General 5.15.2 Final inspections and requirements 6 Marking 6.1 General <\/td>\n<\/tr>\n | ||||||
| 24<\/td>\n | 6.2 Information for marking 6.3 Marking on capacitors 6.4 Marking on packaging 7 Information to be given in a detail specification 7.1 General 7.2 Outline drawing and dimensions <\/td>\n<\/tr>\n | ||||||
| 25<\/td>\n | 7.3 Mounting 7.4 Ratings and characteristics 7.4.1 General 7.4.2 Nominal capacitance range 7.4.3 Particular characteristics 7.4.4 Soldering 7.5 Marking 8 Quality assessment procedures 8.1 Primary stage of manufacture 8.2 Structurally similar components <\/td>\n<\/tr>\n | ||||||
| 26<\/td>\n | 8.3 Certified test records of released lots 8.4 Qualification approval procedures 8.4.1 General 8.4.2 Qualification approval on the basis of the fixed sample size procedure <\/td>\n<\/tr>\n | ||||||
| 27<\/td>\n | Table 8 \u2013 Test and sampling plan for qualification approval Assessment level EZ <\/td>\n<\/tr>\n | ||||||
| 28<\/td>\n | Table 9 \u2013 Test schedule for qualification approval <\/td>\n<\/tr>\n | ||||||
| 34<\/td>\n | Annex A (normative) Quality conformance inspection A.1 Formation of inspection lots A.1.1 Groups A and B inspection A.1.2 Group C inspection A.2 Test schedule A.3 Delayed delivery A.4 Assessment levels <\/td>\n<\/tr>\n | ||||||
| 35<\/td>\n | Table A.1 \u2013 Lot-by-lot inspection <\/td>\n<\/tr>\n | ||||||
| 36<\/td>\n | Table A.2 \u2013 Periodic inspection <\/td>\n<\/tr>\n | ||||||
| 41<\/td>\n | Annex X (informative) Cross-references to the previous edition of this document Table X.1 \u2013 Cross-reference <\/td>\n<\/tr>\n | ||||||
| 42<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Fixed capacitors for use in electronic equipment – Sectional specification. Fixed metallized polyethylene naphthalate film dielectric surface mount DC capacitors<\/b><\/p>\n |