{"id":458322,"date":"2024-10-20T09:56:09","date_gmt":"2024-10-20T09:56:09","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bsi-24-30491834-dc\/"},"modified":"2024-10-26T18:28:42","modified_gmt":"2024-10-26T18:28:42","slug":"bsi-24-30491834-dc","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bsi-24-30491834-dc\/","title":{"rendered":"BSI 24\/30491834 DC"},"content":{"rendered":"
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
6<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 4 Test environmental conditions 5 Test system 5.1 General <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 5.2 Gas flowmeter 5.3 Gas chamber 5.4 Image storage device 5.5 Image analysis system 6 Test methods 6.1 Preparation before test 6.2 Sensitivity test 6.2.1 General 6.2.2 Test procedure <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 6.2.3 Data analysis 6.3 Limit of detection test 6.3.1 General 6.3.2 Test procedure <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 6.3.3 Data analysis 6.4 Selectivity test 6.4.1 General 6.4.2 Test procedure 6.4.3 Data analysis <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 6.5 Response time test 6.5.1 General 6.5.2 Test procedure 6.5.3 Data analysis <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 6.6 Repeatability test 6.6.1 General 6.6.2 Test procedure <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | 6.6.3 Data analysis 6.7 Stability test 6.7.1 General 6.7.2 Test procedure 6.7.3 Data analysis <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | 7 Test report <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | Annex A (informative) Principle and type of CMOS imager-based gas sensor A.1 Principle A.2 Type <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | Annex B (informative) Test report template <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Draft BS EN 60747-14-12 ED1 Semiconductor devices – Part 14-12: Semiconductor sensors – Performance test methods for CMOS imager-based gas sensors<\/b><\/p>\n |