{"id":82349,"date":"2024-10-18T03:04:18","date_gmt":"2024-10-18T03:04:18","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-389-1997\/"},"modified":"2024-10-24T19:49:53","modified_gmt":"2024-10-24T19:49:53","slug":"ieee-389-1997","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-389-1997\/","title":{"rendered":"IEEE 389 1997"},"content":{"rendered":"

Revision Standard – Active. A number of tests are presented for use in determining the significant parameters and performance characteristics of electronics transformers and inductors. These tests are designed primarily for transformers and inductors used in all types of electronics applications, but they may apply to the other types of transformers of large apparent-power rating used in the electric power utility industry.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
1<\/td>\nTitle Page <\/td>\n<\/tr>\n
3<\/td>\nIntroduction
Participants <\/td>\n<\/tr>\n
5<\/td>\nCONTENTS <\/td>\n<\/tr>\n
9<\/td>\n1. Overview
1.1 Scope
1.2 Transformers and inductors <\/td>\n<\/tr>\n
10<\/td>\n2. References <\/td>\n<\/tr>\n
11<\/td>\n3. Definitions
4. How to specify electronics transformers
5. Insulation and corona tests
5.1 General <\/td>\n<\/tr>\n
15<\/td>\n5.2 Electric strength test (hi-pot test) <\/td>\n<\/tr>\n
16<\/td>\n5.3 Induced potential test <\/td>\n<\/tr>\n
18<\/td>\n5.4 Corona tests <\/td>\n<\/tr>\n
21<\/td>\n6. DC resistance tests
6.1 General
6.2 Resistance values under 1 \u00bd\u2014Kelvin double-bridge method <\/td>\n<\/tr>\n
22<\/td>\n6.3 Resistance values from 1 \u00bd to many kilohms <\/td>\n<\/tr>\n
25<\/td>\n6.4 Digital ohmmeter\u2014Resistance values from under 1 \u00bd to many kilohms <\/td>\n<\/tr>\n
26<\/td>\n7. Loss measurements
7.1 No-load loss <\/td>\n<\/tr>\n
30<\/td>\n7.2 Excitation apparent-power measurements
7.3 Stray-load losses <\/td>\n<\/tr>\n
32<\/td>\n7.4 Short-circuit power test <\/td>\n<\/tr>\n
33<\/td>\n7.5 Efficiency and power factor <\/td>\n<\/tr>\n
34<\/td>\n8. Ratio of transformation
8.1 General <\/td>\n<\/tr>\n
36<\/td>\n8.2 Measurement methods <\/td>\n<\/tr>\n
37<\/td>\n8.3 Impedance unbalance <\/td>\n<\/tr>\n
39<\/td>\n8.4 Balance tests
8.5 Polarity tests <\/td>\n<\/tr>\n
41<\/td>\n9. Transformer capacitance
9.1 General <\/td>\n<\/tr>\n
42<\/td>\n9.2 Interwinding capacitance <\/td>\n<\/tr>\n
43<\/td>\n9.3 Distributed capacitance <\/td>\n<\/tr>\n
44<\/td>\n9.4 Bridge methods
10. Inductance measurements by impedance bridge method
10.1 General <\/td>\n<\/tr>\n
45<\/td>\n10.2 Method of measurement <\/td>\n<\/tr>\n
49<\/td>\n11. Transformer response measurements
11.1 Transformer frequency response <\/td>\n<\/tr>\n
51<\/td>\n11.2 Transformer pulse response <\/td>\n<\/tr>\n
53<\/td>\n12. Noise tests
12.1 Test conditions for audible noise
12.2 Measurement of audible noise <\/td>\n<\/tr>\n
54<\/td>\n13. Terminated impedance measurements
13.1 General
13.2 Return-loss method <\/td>\n<\/tr>\n
56<\/td>\n14. Temperature rise tests
14.1 Test methods <\/td>\n<\/tr>\n
57<\/td>\n14.2 Notes on the technique of measurement <\/td>\n<\/tr>\n
58<\/td>\n15. Self-resonance
15.1 General
15.2 Measurement <\/td>\n<\/tr>\n
59<\/td>\n16. Voltage-time product rating
16.1 General <\/td>\n<\/tr>\n
60<\/td>\n16.2 Recommended voltage-time product test methods <\/td>\n<\/tr>\n
61<\/td>\n17. Shielding
17.1 Electrostatic shielding <\/td>\n<\/tr>\n
65<\/td>\n17.2 Magnetic shielding
18. Measurement of quality factor Q
18.1 Definition <\/td>\n<\/tr>\n
66<\/td>\n18.2 Methods
18.3 Bridge measurements
18.4 Q-Meter measurements <\/td>\n<\/tr>\n
67<\/td>\n18.5 Transmission method <\/td>\n<\/tr>\n
68<\/td>\n18.6 Damped oscillation method <\/td>\n<\/tr>\n
71<\/td>\n19. Common-mode rejection test <\/td>\n<\/tr>\n
72<\/td>\n20. Inrush-current evaluation and measurement
20.1 Measurement
20.2 Calculation <\/td>\n<\/tr>\n
73<\/td>\n20.3 Other considerations <\/td>\n<\/tr>\n
74<\/td>\n21. Current transformer test
21.1 General
21.2 Recommended test procedure for current-transformation ratio and phase angle <\/td>\n<\/tr>\n
75<\/td>\n22. Bibliography <\/td>\n<\/tr>\n
77<\/td>\nAnnex A\u2014Instrumentation for voltage and current measurements on inductors and transformers <\/td>\n<\/tr>\n
79<\/td>\nAnnex B\u2014AC High-potential dielectric testing <\/td>\n<\/tr>\n
81<\/td>\nAnnex C\u2014An ac magnetic filed pickup probe <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

IEEE Recommended Practice for Testing Electronics Transformers and Inductors<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
IEEE<\/b><\/a><\/td>\n1997<\/td>\n81<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":82350,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2644],"product_tag":[],"class_list":{"0":"post-82349","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-ieee","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/82349","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/82350"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=82349"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=82349"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=82349"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}