UNE-EN 60749-43:2017
$25.35
Semiconductor devices – Mechanical and climatic test methods – Part 43: Guidelines for IC reliability qualification plans
| Published By | Publication Date | Number of Pages |
| AENOR | 2017-10-01 | 46 |
| Published Code | AENOR |
|---|---|
| Published By | Asociación Española de Normalización |
| Publication Date | 2017-10-01 |
| Pages Count | 46 |
| Language | English |
| File Size | 2.6 MB |
| ICS Codes | 31.080.01 - Semiconductor devices in general |
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