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ASTM-D150:2011 Edition

ASTM-D150:2011 Edition

$44.96

D150-11 Standard Test Methods for AC Loss Characteristics and Permittivity (Dielectric Constant) of Solid Electrical Insulation

Published By Publication Date Number of Pages
ASTM 2011 20
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1.1 These test methods cover the determination of relative permittivity, dissipation factor, loss index, power factor, phase angle, and loss angle of specimens of solid electrical insulating materials when the standards used are lumped impedances. The frequency range addressed extends from less than 1 Hz to several hundred megahertz.

Note 1In common usage, the word relative is frequently dropped.

1.2 These test methods provide general information on a variety of electrodes, apparatus, and measurement techniques. A reader interested in issues associated with a specific material needs to consult ASTM standards or other documents directly applicable to the material to be tested. ,

1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. For specific hazard statements, see 7.2.6.1 and 10.2.1.

PDF Catalog

PDF Pages PDF Title
1 Scope
Referenced Documents
Terminology
2 FIG. 1
FIG. 2
FIG. 3
FIG. 4
3 Summary of Test Method
Significance and Use
General Measurement Considerations
FIG. 5
4 FIG. 6
TABLE 1
5 TABLE 2
FIG. 7
6 FIG. 8
7 Electrode Systems
FIG. 9
8 FIG. 10
9 Choice of Apparatus and Methods for Measuring Capacitance and AC Loss
10 Sampling
Procedure
12 Report
Precision and Bias
Keywords
TABLE 3
13 X1. CORRECTIONS FOR SERIES INDUCTANCE AND RESISTANCE AND STRAY CAPACITANCES
X1.1
X1.2
X1.3
X1.4
X2. EFFECTIVE AREA OF GUARDED ELECTRODE
X2.1
X2.2
X2.3
X2.4
14 X2.5
FIG. X2.1
15 X3. FACTORS AFFECTING PERMITTIVITY AND LOSS CHARACTERISTICS
X3.1 Frequency
X3.2 Temperature
X3.3 Voltage
X3.4 Humidity
FIG. X3.1
16 X3.5 Water Immersion
X3.6 Weathering
X3.7 Deterioration
X3.8 Conditioning
X4. CIRCUIT DIAGRAMS OF TYPICAL MEASURING CIRCUITS
X4.1
FIG. X4.1
17 FIG. X4.2
FIG. X4.3
FIG. X4.4
FIG. X4.5
18 FIG. X4.6
FIG. X4.7
19 REFERENCES
FIG. X4.8
FIG. X4.9

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