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ASTM-E1162:2011 Edition(Redline)

$28.17

E1162-11 Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS) (Redline)

Published By Publication Date Number of Pages
ASTM 2011 3
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Standard Title

E1162-11 Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS) (Redline)

Published Code

ASTM

Publication Date

2011

Pages Count

3

ICS Codes 71.040.50 - Physicochemical methods of analysis
ASTM-E1162
$28.17