BS EN 60444-2:1997:1993 Edition
$102.76
Measurement of quartz crystal unit parameters – Phase offset method for measurement of motional capacitance of quartz crystal units
| Published By | Publication Date | Number of Pages |
| BSI | 1993 | 16 |
| Status | Definitive |
|---|---|
| Pages | 16 |
| Publication Date | 1993-09-15 |
| ISBN | 0 580 22497 X |
| Standard Number | BS EN 60444-2:1997, IEC 60444-2:1980 |
| Title | Measurement of quartz crystal unit parameters – Phase offset method for measurement of motional capacitance of quartz crystal units |
| Identical National Standard Of | IEC 60444-2:1980, EN 60444-2:1997 |
| Descriptors | Piezoelectric devices, Resonators, Capacitance, Capacitance measurement, Circuit networks, Electrical wave measurement, Phase measurement (electric), Electrical measurement, Dielectric properties, Wave properties and phenomena, Crystal resonators, Dielectric devices, Resonant frequency, Circuits, Frequencies, Frequency measurement, Quartz, Mathematical calculations, Errors |
| Publisher | BSI |
| Committee | W/- |
| ICS Codes | 31.140 - Piezoelectric devices |
