BS EN 60679-1:1998:2004 Edition
$215.11
Quartz crystal controlled oscillators of assessed quality – Generic specification
| Published By | Publication Date | Number of Pages |
| BSI | 2004 | 86 |
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 1 | BRITISH STANDARD |
| 2 | National foreword |
| 4 | Foreword Foreword to amendment A1 Foreword to amendment A2 |
| 5 | Contents |
| 9 | 1.1 Scope 1.2 Normative references |
| 11 | 1.3 Order of precedence 2 Terminology and general requirements 2.1 General 2.2 Definitions |
| 14 | Figure 1 Example of the use of frequency offset |
| 17 | Figure 2 Typical frequency fluctuation characteristics |
| 18 | Figure 3 Characteristics of an output waveform |
| 19 | Figure 49 Clock signal with phase jitter |
| 20 | Figure 50 Phase jitter measures Figure 51 Gaussian distribution of jitter |
| 21 | Figure 52 Jitter amplitude and period of jitter frequency Figure 53 Jitter tolerance according to ITU-T G.825, ANSI T1.105.03, Telcordia GR-253 and ETSI EN 300462 |
| 22 | 2.3 Preferred values for ratings and characteristics |
| 23 | 2.4 Marking 3 Quality assessment procedures 3.1 Primary stage of manufacture 3.2 Structurally similar components |
| 24 | 3.3 Subcontracting 3.4 Incorporated components 3.5 Manufacturer’s approval 3.6 Approval procedures |
| 25 | 3.7 Procedures for capability approval 3.8 Procedures for qualification approval 3.9 Test procedures 3.10 Screening requirements 3.11 Rework and repair work |
| 26 | 3.12 Certified test records 3.13 Validity of release 3.14 Release for delivery 3.15 Unchecked parameters 4 Test and measurement procedures 4.1 General 4.2 Test and measurement conditions |
| 27 | 4.3 Visual inspection |
| 28 | 4.4 Dimensions and gauging procedures 4.5 Electrical test procedures Figure 4 Test circuits for insulation resistance measurements |
| 29 | Figure 5 Test circuit for voltage proof test |
| 30 | Figure 6 Test circuit for oscillator input power measurement Figure 7 Test circuit for oven and oscillator input power measurement |
| 31 | Figure 8 Test circuit for measurement of output frequency, method 1 |
| 32 | Figure 9 Test circuit for measurement of output frequency, method 2 |
| 33 | Figure 10 Test circuit for measurement of frequency/temperature characteristics |
| 34 | Figure 11 Thermal transient behaviour of typical oscillator |
| 36 | Figure 12 Generalized oscillator circuit Figure 13 Test circuit for start-up behaviour and start-up time measurement |
| 37 | Figure 14 Typical start-up behaviour with slow supply voltage ramp |
| 38 | Figure 15 Definition of start-up time Figure 16 Supply voltage waveform for periodical |
| 39 | Figure 17 Typical oscillator stabilization characteristic |
| 40 | Figure 18 Example of retrace characteristic Figure 19 Test circuit for the measurement of output voltage |
| 41 | Figure 20 Test circuit for the measurement of pulse outputs Figure 21 Test circuit for harmonic distortion measurement |
| 42 | Figure 22 Quasi-sinusoidal output waveforms |
| 43 | Figure 23 Frequency spectrum for harmonic distortion |
| 45 | Figure 24 Test circuit for the determination of isolation between output ports |
| 46 | Figure 25 Test circuit for measuring suppression of gated oscillators Figure 26 Test circuit for tri-state disable mode output current |
| 47 | Figure 27 Test circuit for output gating time — tri-state |
| 48 | Figure 28 Test circuit for modulation index measurement Figure 29 Modulation waveform for index calculation |
| 49 | Figure 30 Logarithmic signal amplitude scale |
| 50 | Figure 31 Test circuit to determine amplitude modulation sensitivity Figure 32 Frequency spectrum of amplitude modulation distortion |
| 51 | Figure 33 Test circuit to determine pulse amplitude modulation |
| 52 | Figure 34 Pulse modulation characteristic |
| 53 | Figure 35 Test circuit for the determination of modulation input impedance |
| 54 | Figure 36 Test circuit for the measurement of f.m. deviation |
| 55 | Figure 37 Test circuit for the measurement of f.m. sensitivity |
| 56 | Figure 38 Test circuit for the measurement of frequency modulation distortion |
| 57 | Figure 39 Test circuit for the measurement of single-sideband phase noise |
| 59 | Figure 40 Typical noise pedestal spectrum |
| 61 | Figure 41 Test circuit for the measurement of incidental frequency modulation |
| 62 | Figure 42 Test circuit for method 1 |
| 63 | Figure 43 Test circuit for method 2 |
| 64 | Figure 44 Circuit modifications for methods 1 and 2 Figure 45 Time-domain short-term frequency stability of a typical�5�MHz precision oscillator |
| 67 | Figure 47 Characteristics of line impedance of stabilizing network Figure 48 Circuit diagram of line impedance of stabilizing network |
| 68 | Table 1 Measuring sets bandwidths |
| 69 | Figure 54 Phase jitter measurement with sampling oscilloscope |
| 70 | Table 6 Fourier frequency range for phase noise test |
| 71 | Figure 55 Block diagram of a jitter and wander analyser according to ITU-T 0.172 Table 7 Standard bit rates for various applications 4.6 Mechanical and environmental test procedures |
| 72 | Table 2 Tensile force Table 3 Thrust force Table 4 Bending force |
| 73 | Table 5 Torque force |
| 76 | 4.7 Endurance test procedure |
| 78 | Annex A (normative) Load circuit for logic drive A.1 TTL and Schottky Figure A.1 Circuit for TTL Figure A.2 Circuit for Schottky logic |
| 79 | Table A.1 Values to be used when calculating A.2 CMOS A.3 ECL |
| 80 | Annex B (informative) Latch-up test B.1 Definition B.1.1 Latch-up B.1.2 Test procedure B.2 Test method B.2.1 This test is destructive. B.2.2 This test is applicable only to quartz crystal controlled oscillators containing CMOS integrated … B.2.3 This test shall be performed in accordance with IEC 60748-2. B.2.4 This test is a recommended test procedure. It is not a specification. No test limits are given. B.2.5 This test is performed for characterization and inspection purposes only. It is not a production … |
| 81 | Annex C (normative) Electrostatic discharge sensitivity classification C.1 Definition C.1.1 Electrostatic discharge (ESD) C.1.2 Test procedure C.2 Test methods |
| 82 | Annex ZA (normative) Normative references to international publications with their corresponding European … |
| 85 | Bibliography |
