BS EN 61000-4-20:2010:2011 Edition
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Electromagnetic compatibility (EMC) – Testing and measurement techniques. Emission and immunity testing in transverse electromagnetic (TEM) waveguides
| Published By | Publication Date | Number of Pages |
| BSI | 2011 | 80 |
IEC 61000-4-20:2010 relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These types include open structures (for example, striplines and electromagnetic pulse simulators) and closed structures (for example, TEM cells). These structures can be further classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type. The object of this standard is to describe: – TEM waveguide characteristics, including typical frequency ranges and EUT-size limitations; – TEM waveguide validation methods for EMC tests; – the EUT (i.e. EUT cabinet and cabling) definition; – test set-ups, procedures, and requirements for radiated emission testing in TEM waveguides and – test set-ups, procedures, and requirements for radiated immunity testing in TEM waveguides. IEC 61000-4-20:2010 does not intend to specify the tests to be applied to any particular apparatus or system(s). The main intention of this standard is to provide a general basic reference for all interested product committees of the IEC. For radiated emissions testing, product committees should select emission limits and test methods in consultation with CISPR standards. For radiated immunity testing, product committees remain responsible for the appropriate choice of immunity tests and immunity test limits to be applied to equipment within their scope. This standard describes test methods that are separate from those of IEC 61000-4-3. This second edition cancels and replaces the first edition published in 2003 and its amendment 1 (2006), and constitutes a technical revision. It has the status of a basic EMC publication in accordance with IEC Guide 107. The main changes with respect to the first edition of this standard and its amendment are the following: – consistency of terms (e.g. test, measurement, etc.) has been improved; – clauses covering test considerations, evaluations and the test report have been added; – references to large TEM waveguides have been eliminated; – a new informative annex has been added to deal with calibration of E-field probes.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 6 | English CONTENTS |
| 8 | INTRODUCTION |
| 9 | 1 Scope and object 2 Normative references |
| 10 | 3 Terms, definitions and abbreviations 3.1 Terms and definitions |
| 13 | 3.2 Abbreviations 4 General |
| 14 | 5 TEM waveguide requirements 5.1 General 5.2 General requirements for the use of TEM waveguides |
| 17 | 5.3 Special requirements and recommendations for certain types of TEM waveguides Tables Table 1 – Values K for expanded uncertainty with normal distribution |
| 18 | 6 Overview of EUT types 6.1 General 6.2 Small EUT 6.3 Large EUT |
| 19 | 7 Laboratory test conditions 7.1 General 7.2 Climatic conditions 7.3 Electromagnetic conditions 8 Evaluation and reporting of test results |
| 21 | Annex A (normative) Emission testing in TEM waveguides |
| 32 | Figures Figure A.1 – Routing the exit cable to the corner at the ortho-angle and the lower edge of the test volume |
| 33 | Figure A.2 – Basic ortho-axis positioner or manipulator |
| 34 | Figure A.3 – Three orthogonal axis-rotation positions for emission measurements |
| 35 | Figure A.4 – Twelve-face (surface) and axis orientations for a typical EUT |
| 36 | Figure A.5 – Open-area test site (OATS) geometry |
| 37 | Figure A.6 – Two-port TEM cell (symmetric septum) |
| 38 | Figure A.7 – One-port TEM cell (asymmetric septum) |
| 40 | Figure A.8 – Stripline (two plates) |
| 41 | Figure A.9 – Stripline (four plates, balanced feeding) |
| 42 | Annex B (normative) Immunity testing in TEM waveguides |
| 44 | Table B.1 – Uniform area calibration points Table B.2 – Test levels |
| 46 | Figure B.1 – Example of test set-up for single-polarization TEM waveguides |
| 47 | Figure B.2 – Uniform area calibration points in TEM waveguide |
| 48 | Annex C (normative) HEMP transient testing in TEM waveguides |
| 54 | Figure C.1 – Frequency domain spectral magnitude between 100 kHz and 300 MHz Table C.1 – Radiated immunity test levels defined in the present standard |
| 55 | Annex D (informative) TEM waveguide characterization |
| 61 | Figure D.1 – Simple waveguide (no TEM mode) Figure D.2 – Example waveguides for TEM-mode propagation Figure D.3 – Polarization vector Figure D.4 – Transmission line model for TEM propagation |
| 62 | Figure D.5 – One- and two-port TEM waveguides |
| 63 | Annex E (informative) Calibration method for E-field probes in TEM waveguides |
| 64 | Figure E.1 – An example of the measurement points for the validation |
| 65 | Figure E.2 – Setup for validation of perturbation Table E.1 – Calibration frequencies |
| 66 | Table E.2 – Calibration field strength level |
| 68 | Figure E.3 – Setup for measuring net power to a transmitting device |
| 69 | Figure E.4 – Example of setup for calibration of E-field probe |
| 71 | Figure E.5 – Setup for calibration of E-field probe by another method |
| 72 | Figure E.6 – Equivalent circuit of antenna and measurement apparatus |
| 73 | Bibliography |
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