Name: BS EN 62373:2006 PDF - PDF Standards Store
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BS EN 62373:2006

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Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

Published By	Publication Date	Number of Pages
BSI	2006	16

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Categories: 31.080.30 - Transistors, BSI

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Status	Definitive
Pages	16
Publication Date	2006-09-29
ISBN	0 580 49255 9
Standard Number	BS EN 62373:2006
Title	Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Identical National Standard Of	EN 62373:2006, IEC 62373:2006, EN 50289-3-7:2001
Descriptors	Semiconductors, Semiconductor devices, Testing conditions, Transistors, Metal oxide semiconductors, Temperature, Voltage measurement, Electronic equipment and components
Publisher	BSI
Committee	EPL/47
ICS Codes	31.080.30 - Transistors


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