🔥🔥 Don’t Miss Out on Our End of Autumn Sale. If you have any questions, feel free to click the bottom right corner to contact our customer service..

Concat us[email protected]
Shopping Cart

No products in the cart.

🔍
BS EN IEC 62271-101:2021:2022 Edition

BS EN IEC 62271-101:2021:2022 Edition

$256.21

High-voltage switchgear and controlgear – Synthetic testing

Published By Publication Date Number of Pages
BSI 2022 172
PDF Format Searchable Printable Preview Now
Guaranteed Safe Checkout
Categories: ,

If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. We’re here to assist you 24/7.
Email:[email protected]

PDF Catalog

PDF Pages PDF Title
2 undefined
6 National foreword
9 Annex ZA(normative)Normative references to international publicationswith their corresponding European publications
12 English
CONTENTS
19 FOREWORD
21 1 Scope
2 Normative references
3 Terms and definitions
23 4 Synthetic testing techniques and methods for short-circuit breaking tests
4.1 Basic principles and general requirements for synthetic breaking test methods
4.1.1 General
24 4.1.2 High-current interval
Figures
Figure 1 – Interrupting process – Basic time intervals
25 4.1.3 Interaction interval
4.1.4 High-voltage interval
Tables
Table 1 – Tolerances and limits required during the high-current interval
27 Figure 2 – Examples of evaluation of initial recovery voltage
28 4.2 Synthetic test circuits and related specific requirements for breaking tests
4.2.1 Current injection methods
29 4.2.2 Voltage injection method
Figure 3 – Equivalent surge impedance of the voltage circuit for the current injection method
30 4.2.3 Duplicate circuit method (transformer or Skeats circuit)
4.2.4 Other synthetic test methods
4.3 Three-phase synthetic test methods
31 Table 2 – Test circuits for test duties T100s and T100a
Table 3 – Test parameters during three-phase interruption for test-duties T10, T30, T60 and T100s, kpp = 1,5
32 Figure 4 – Reference lines of TRV with four-parameter for kpp = 1,5
Table 4 – Test parameters during three-phase interruption for test-duties T10, T30, T60 and T100s, kpp = 1,3
33 Figure 5 – Reference lines of TRV with four-parameter for kpp = 1,3
Table 5 – Test parameters during three phase interruption for test-duties T10, T30, T60 and T100s, kpp = 1,2
34 5 Synthetic testing techniques and methods for short-circuit making tests
5.1 Basic principles and general requirements for synthetic making test methods
5.1.1 General
Figure 6 – Reference lines of TRV with four-parameter for kpp = 1,2
36 Figure 7 – Making process – Basic time intervals
37 5.1.2 High-voltage interval
5.1.3 Pre-arcing interval
5.1.4 Latching interval and fully closed position
5.2 Synthetic test circuit and related specific requirements for making tests
5.2.1 General
5.2.2 Test circuit and test requirements
39 Figure 8 – Example of synthetic making circuit for single-phase tests
40 Figure 9 – Example of synthetic making circuit for out-of-phase tests
41 Figure 10 – Example of synthetic making circuit for three-phase tests (kpp = 1,5)
42 5.2.3 Alternative test method with reduced voltage
43 7 Type tests
7.102 General
Table 6 – Symbols and abbreviated terms used for operation during synthetic tests
44 7.104 Demonstration of arcing times
47 Figure 11 – Comparison of arcing time settings during three-phase direct tests (left) and three-phase synthetic (right) for T100s with kpp = 1,5
48 Figure 12 – Comparison of arcing time settings during three-phase direct tests (left) and three-phase synthetic (right) for T100s with kpp = 1,3
51 Figure 13 – Comparison of arcing time settings during three-phase direct tests (left) and three-phase synthetic tests (right) for T100a with kpp = 1,5
52 Figure 14 – Comparison of arcing time settings during three-phase direct tests (left) and three-phase synthetic tests (right) for T100a with kpp = 1,3
55 7.107 Terminal fault tests
56 Table 7 – Synthetic test methods for test duties T10, T30, T60,T100s, T100a, SP, DEF, OP and SLF
59 7.109 Short-line fault tests
60 7.110 Out-of-phase making and breaking tests
7.111 Capacitive current tests
62 Figure 15 – Evaluation of recovery voltage during synthetic capacitive current switching testing
63 Annexes
Annex A (normative) Correction of di/dt and TRV for test duty T100a
A.1 General
A.2 Reduction in di/dt
A.3 Corrected TRV for the first-pole-to-clear with required asymmetry
64 Table A.1 – Corrected TRV values for the first-pole-to-clear for kpp = 1,3 and fr = 50 Hz
65 Table A.2 – Corrected TRV values for the first-pole-to-clear for kpp = 1,3 and fr = 60 Hz
67 Table A.3 – Corrected TRV values for the first-pole-to-clear for kpp = 1,5 and fr = 50 Hz
68 Table A.4 – Corrected TRV values for the first-pole-to-clear for kpp = 1,5 and fr = 60 Hz
Table A.5 – Corrected TRV values for the first-pole-to-clear for kpp = 1,2 and fr = 50 Hz
69 Table A.6 – Corrected TRV values for the first-pole-to-clear for kpp = 1,2 and fr = 60 Hz
Table A.7 – Percentage of DC component and di/dt at current zero for first-pole-to-clear for fr = 50 Hz
70 A.4 Correction of the di/dt and TRV of the first-pole-to-clear for tests with intermediate asymmetry
Table A.8 – Percentage of DC component and di/dt at current zero for first-pole-to-clear for fr = 60 Hz
71 A.5 Correction of the di/dt and TRV of the second- or last-pole-to-clear with major extended loop with required asymmetry during three-phase tests
A.6 Correction of the di/dt and TRV during tests with a subsequent minor loop
A.7 Calculation of the di/dt and TRV of the first-pole-to-clear
A.7.1 General
A.7.2 Calculation of di/dt
72 A.7.3 Calculation of TRV
74 A.7.4 Examples of calculation of di/dt and TRV
76 Annex B (normative) Tolerances on test quantities for type tests
77 Table B.1 – Tolerances on test quantities for type tests
79 Annex C (normative) Information to be given and results to be recorded for synthetic tests
C.1 General
C.2 Auxiliary circuit-breaker
C.3 Test conditions
C.4 Quantities to be recorded
C.4.1 General
C.4.2 Voltages
C.4.3 Currents
80 Annex D (normative) Test procedure using a three-phase current circuit and one voltage circuit
D.1 Test circuit
81 D.2 Test method
D.2.1 General
D.2.2 Test duty T100s(b)
Figure D.1 – Example of a three-phase current circuit with single-phase synthetic injection
82 Table D.1 – Demonstration of arcing times for kpp = 1,5
83 Figure D.2 – Representation of the testing conditions of Table D.1
84 Table D.2 – Alternative demonstration of arcing times for kpp = 1,5
85 Figure D.3 – Representation of the testing conditions of Table D.2
86 Table D.3 – Demonstration of arcing times for kpp = 1,3
87 Figure D.4 – Representation of the testing conditions of Table D.3
88 Table D.4 – Alternative demonstration of arcing times for kpp = 1,3
89 Figure D.5 – Representation of the testing conditions of Table D.4
90 D.2.3 Test duty T100a
91 Table D.5 – Demonstration of arcing times for kpp = 1,5
92 Figure D.6 – Representation of the testing conditions of Table D.5
93 Table D.6 – Alternative demonstration of arcing times for kpp = 1,5
94 Figure D.7 – Representation of the testing conditions of Table D.6
95 Table D.7 – Demonstration of arcing times for kpp = 1,3
96 Figure D.8 – Representation of the testing conditions of Table D.7
97 Table D.8 – Alternative demonstration of arcing times for kpp = 1,3
98 Figure D.9 – Representation of the testing conditions of Table D.8
99 D.2.4 Combination of first-pole-to-clear factors 1,3 and 1,5
Table D.9 – Procedure for combining kpp = 1,5 and 1,3 during test-duties T10, T30, T60 and T100s(b)
100 Table D.10 – Procedure for combining kpp = 1,5 and 1,3 during test-duty T100a
102 Annex E (normative) Splitting of test duties in test series taking into account the associated TRV for each pole-to-clear
E.1 General
E.2 Test-duties T10, T30, T60, T100s(b), OP1 and OP2(b)
E.2.1 Test procedure for first-pole-to-clear factors 1,5 and 2,5
Table E.1 – Test procedure for kpp = 1,5 and 2,5
103 E.2.2 Test procedure for first-pole-to-clear factors 1,3 and 2,0
Table E.2 – Test procedure for kpp = 1,3 and 2,0
104 E.2.3 Test procedure for first-pole-to-clear factor 1,2
Table E.3 – Simplified test procedure for kpp = 1,3 and 2,0
105 E.3 Test duty T100a
E.3.1 General
Table E.4 – Test procedure for kpp = 1,2
Table E.5 – Simplified test procedure for kpp = 1,2
106 E.3.2 Test procedure for first-pole-to-clear factor 1,5
Table E.6 – Test procedure for asymmetrical currents for kpp = 1,5
107 E.3.3 Test procedure for first-pole-to-clear factor 1,3
Figure E.1 – Example of graphical representation of the tests shown in Table E.6
108 Table E.7 – Test procedure for asymmetrical currents for kpp = 1,3
109 E.3.4 Test procedure for first-pole-to-clear factor 1,2
Figure E.2 – Example of graphical representation of the tests shown in Table E.7 and Table E.8
110 E.4 Combination of first-pole-to-clear factors
E.4.1 General
E.4.2 Combination of first-pole-to-clear factors 1,3 and 1,5 for test duties T10, T30, T60 and T100s(b)
Table E.8 – Test procedure for asymmetrical currents for kpp = 1,2
111 E.4.3 Combination of first-pole-to-clear factors 2,0 and 2,5 for test duties OP1 and OP2(b)
Table E.9 – Procedure for combining kpp = 1,3 and 1,5 for test-duties T10, T30, T60 and T100s(b)
112 E.4.4 Combination of first-pole-to-clear factors 1,3 and 1,5 for test duty T100a
Table E.10 – Procedure for combining kpp = 2,0 and 2,5 for test-duties OP1 and OP2(b)
113 Table E.11 – Procedure for combining kpp = 1,5 and 1,3 for test-duty T100a
114 Table E.12 – Required test parameters for different asymmetrical conditions in the case of kpp = 1,5, fr = 50 Hz
116 Table E.13 – Required test parameters for different asymmetrical conditions in the case of a kpp = 1,3, fr = 50 Hz
118 Table E.14 – Required test parameters for different asymmetrical conditions in the case of kpp = 1,2, fr = 50 Hz
119 Table E.15 – Required test parameters for different asymmetrical conditions in the case of kpp = 1,5, fr = 60 Hz
121 Table E.16 – Required test parameters for different asymmetrical conditions in the case of kpp = 1,3, fr = 60 Hz
123 Table E.17 – Required test parameters for different asymmetrical conditions in the case of kpp = 1,2, fr = 60 Hz
124 Annex F (informative) Three-phase synthetic test circuits
F.1 General
F.2 Three-phase synthetic combined circuit
125 Figure F.1 – Three-phase synthetic combined circuit
126 Figure F.2 – Waveshapes of currents, phase-to-ground and phase-to phase voltages during a three-phase synthetic test (T100s; kpp = 1,5) performed according to the three-phase synthetic combined circuit
127 F.3 Three-phase synthetic circuit with injection in all phases
Figure F.3 – Three-phase synthetic circuit with injection in all phases for kpp = 1,5
128 F.4 Three-phase synthetic circuit with injection in two phases
Figure F.4 – Waveshapes of currents and phase-to-ground voltages during a three-phase synthetic test (T100s; kpp = 1,5) performed according to the three-phase synthetic circuit with injection in all phases
129 Figure F.5 – Three-phase synthetic circuit for terminal fault tests with kpp = 1,3 (current injection method)
130 Figure F.6 – Waveshapes of currents and phase-to-ground voltages during a three phase synthetic test (T100s; kpp = 1,3 ) performed according to the three-phase synthetic circuit shown in Figure F.5
131 Figure F.7 – TRV voltages waveshapes of the test circuit described in Figure F.5
132 Annex G (informative) Examples of test circuits for metal-enclosed and dead tank circuit-breakers
133 Figure G.1 – Example of a test circuit for unit testing (circuit-breaker with interaction due to gas circulation)
134 Figure G.2 – Oscillogram corresponding to Figure G.1 –Example of the required TRVs to be applied between the terminals of the unit(s) under test and between the live parts and the insulated enclosure
135 Figure G.3 – Example of test circuit using two voltage circuits for breaking tests
136 Figure G.4 – Example of test circuit using two voltage circuits for breaking tests
137 Figure G.5 – Example of a synthetic test circuit for unit testing (if unit testing is allowed as per 7.102.4.2 of IEC 62271-100:2021)
138 Figure G.6 – Oscillogram corresponding to Figure G.3 –Example of the required TRVs to be applied between the terminals of the unit(s) under test and between the live parts and the insulated enclosure
139 Figure G.7 – Example of a capacitive current injection circuit with enclosure of the circuit-breaker energized
140 Figure G.8 – Example of a capacitive synthetic circuit using two power-frequency circuits and with the enclosure of the circuit-breaker energized
141 Figure G.9 – Example of a capacitive synthetic current injection circuit – Unit testing on half a pole of a circuit-breaker with two units per pole – Enclosure energized with DC voltage
142 Figure G.10 – Example of a synthetic making circuit for out-of-phase tests
143 Annex H (informative) Step-by-step method to prolong arcing
Figure H.1 – Example of a re-ignition circuit diagram for prolonging arc-duration
144 Figure H.2 – Example of waveforms obtained during a symmetrical test using the circuit in Figure H.1
145 Annex I (informative) Synthetic methods for capacitive current tests
I.1 General
I.2 Recovery voltage
I.3 Combined current and voltage circuits
146 I.4 Making tests
I.5 Current chopping
I.6 Examples test circuits
148 Figure I.1 – Power-frequency circuits in parallel
149 Figure I.2 – Current injection circuit
150 Figure I.3 – Power-frequency current injection circuit
151 Figure I.4 – Current injection circuit, recovery voltage applied to both terminals of the circuit-breaker
152 Figure I.5 – Current injection circuit with decay compensation
153 Figure I.6 – LC oscillating circuit
154 Figure I.7 – Inrush making current test circuit
155 Annex J (normative) Synthetic test methods for circuit-breakers with opening resistors
J.1 General
J.2 Conditions
J.2.1 General
J.2.2 Transient recovery voltage interval
J.2.3 Power-frequency recovery voltage interval
J.3 Multiple step test procedure
J.3.1 General
156 J.3.2 Test to verify the re-ignition behaviour of the making and breaking unit
157 J.3.3 Test to verify the re-ignition behaviour of the making and breaking unit during short circuit test duties with any test method
Figure J.1 – Test circuit to verify re-ignition behaviour of the making and breaking unit using current injection method
158 J.3.4 Tests on resistor switch(s)
Figure J.2 – Test circuit to verify re-ignition behaviour of the making and breaking unit
159 J.4 Test requirements
J.4.1 General
Figure J.3 – Test circuit on the resistor switch
160 J.4.2 Testing of the making and breaking unit
Figure J.4 – Example of test circuit for capacitive current switching tests on the making and breaking unit
161 J.4.3 Testing of the resistor switch
J.4.4 Test of the resistor stack
Figure J.5 – Example of test circuit for capacitive current switching tests on the resistor switch
162 Annex K (informative) Combination of current injection and voltage injection methods
K.1 Current injection methods
K.2 Voltage injection methods
K.3 Combined current and voltage injection circuits
K.3.1 General
K.3.2 Combined current and voltage injection circuit with application of full test voltage to earth
K.3.3 Combined current and voltage injection circuit with separated application of test voltage
163 Figure K.1 – Example of combined current and voltage injection circuit with application of full test voltage to earth
164 Figure K.2 – Example of combined current and voltage injection circuit with separated application of test voltage
165 Bibliography

Related products

BS EN IEC 62271-101:2021
$256.21