IEC 60749-36:2003
$6.50
Semiconductor devices – Mechanical and climatic test methods – Part 36: Acceleration, steady state
| Published By | Publication Date | Number of Pages |
| IEC | 2003-02-13 | 16 |
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.
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