IEC 60749-5:2017
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Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test
| Published By | Publication Date | Number of Pages |
| IEC | 2017-04-10 | 22 |
IEC 60749-5:2017 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
a) correction of an error in an equation;
b) inclusion of notes for guidance;
c) clarification of the applicability of test conditions.
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