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IEEE IEC 61671 6 2016

IEEE IEC 61671 6 2016

$30.33

IEC/IEEE International Standard – Standard for Automatic Test Markup Language (ATML) Test Station Description

Published By Publication Date Number of Pages
IEEE 2016 38
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– Active. An exchange format, using extensible markup language (XML), for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test station may be used with a test program set to test and diagnose a unit under test.

PDF Catalog

PDF Pages PDF Title
1 IEC 61671-6-2016, Adoption of IEEE Std 1671.6-2015 Front Cover
4 CONTENTS
5 FOREWORD
9 Introduction
13 Important Notice
1. Overview
1.1 General
14 1.2 Application of this document’s annexes
1.3 Scope
1.4 Application
1.5 Conventions used within this document
15 2. Normative references
16 3. Definitions, acronyms, and abbreviations
3.1 Definitions
17 3.2 Acronyms and abbreviations
18 4. Schema—TestStationDescription.xsd
4.1 General
4.2 Elements
20 4.3 Child elements
21 4.4 Complex types
22 5. Schema—TestStationInstance.xsd
5.1 General
5.2 Elements
24 5.3 Child elements
5.4 Complex types
26 6. ATML TestStationDescription XML schema names and locations
27 7. ATML XML schema extensibility
28 8. Conformance
8.1 Conformance of a TestStationDescription instance document
8.2 Conformance of a TestStationInstance instance document
29 Annex A (informative) IEEE download website material associated with this document
30 Annex B (informative) User’s information and examples
B.1 Partial automatic test station
33 Annex C (informative) Glossary
34 Annex D (informative) Bibliography
35 Annex E (informative) IEEE List of Participants

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IEEE IEC 61671 6 2016
$30.33