ISO 23830:2008

$19.50

Surface chemical analysis — Secondary-ion mass spectrometry — Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry

Published By	Publication Date	Number of Pages
ISO	2008-11	20

Guaranteed Safe Checkout

Categories: 71.040.40 - Chemical analysis, ISO

If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. We’re here to assist you 24/7.
Email:[email protected]

Description

ISO 23830:2008 specifies a method for confirming the repeatability and constancy of the positive-ion relative-intensity scale of static secondary-ion mass spectrometers, for general analytical purposes. It is only applicable to instruments that incorporate an electron gun for charge neutralization. It is not intended to be a calibration of the intensity/mass response function. That calibration may be made by the instrument manufacturer or another organization. The present method provides data to confirm the constancy of relative intensities with instrument usage. Guidance is given on some of the instrument settings that may affect this constancy.

Additional information

Published Code	ISO
Published By	International Organization for Standardization
Publication Date	2008-11
Pages Count	20
Language	France
Edition	1
File Size	348.2 KB
ICS Codes	71.040.40 - Chemical analysis

Preview PDF


PDF Format	Searchable	Printable	Preview Now

ISO 23830:2008

Related products