{"id":155058,"date":"2024-10-19T09:14:16","date_gmt":"2024-10-19T09:14:16","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-iec-61671-4-2016\/"},"modified":"2024-10-25T01:29:06","modified_gmt":"2024-10-25T01:29:06","slug":"ieee-iec-61671-4-2016","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-iec-61671-4-2016\/","title":{"rendered":"IEEE IEC 61671 4 2016"},"content":{"rendered":"

– Active. An exchange format is specified in this standard, using extensible markup language (XML), for identifying the test configuration used to test for and diagnose faults of a unit under test (UUT) on an automatic test system (ATS).<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
1<\/td>\nIEC 61671-4-2016, Adoption of IEEE Std 1671.4-2014 Front Cover <\/td>\n<\/tr>\n
4<\/td>\nCONTENTS <\/td>\n<\/tr>\n
5<\/td>\nFOREWORD <\/td>\n<\/tr>\n
9<\/td>\nINTRODUCTION <\/td>\n<\/tr>\n
13<\/td>\nImportant Notice
1. Overview
1.1 General <\/td>\n<\/tr>\n
14<\/td>\n1.2 Application of this document\u2019s annexes
1.3 Scope
1.4 Application <\/td>\n<\/tr>\n
15<\/td>\n1.5 Conventions used within this document <\/td>\n<\/tr>\n
16<\/td>\n2. Normative references
3. Definitions, acronyms, and abbreviations
3.1 Definitions <\/td>\n<\/tr>\n
17<\/td>\n3.2 Acronyms and abbreviations <\/td>\n<\/tr>\n
19<\/td>\n4. TestConfiguration schema
4.1 Background
4.2 Test configuration.xsd <\/td>\n<\/tr>\n
44<\/td>\n5. TestConfiguration instance schema
6. ATML TestConfiguration XML schema names and locations <\/td>\n<\/tr>\n
46<\/td>\n7. ATML XML schema extensibility
8. Conformance <\/td>\n<\/tr>\n
47<\/td>\nAnnex A (informative) IEEE download web-site material associated with this document <\/td>\n<\/tr>\n
48<\/td>\nAnnex B (informative) Test Configuration XML element mappings to MTPSI card fields <\/td>\n<\/tr>\n
53<\/td>\nAnnex C (informative) Examples <\/td>\n<\/tr>\n
56<\/td>\nAnnex D (informative) Bibliography <\/td>\n<\/tr>\n
57<\/td>\nAnnex E (informative) IEEE List of Participants <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

IEC\/IEEE International Standard – Standard for Automatic Test Markup Language (ATML) Test Configuration<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
IEEE<\/b><\/a><\/td>\n2016<\/td>\n60<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":155060,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2644],"product_tag":[],"class_list":{"0":"post-155058","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-ieee","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/155058","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/155060"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=155058"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=155058"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=155058"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}