{"id":255701,"date":"2024-10-19T16:54:17","date_gmt":"2024-10-19T16:54:17","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bsi-pd-iec-tr-62361-1032018\/"},"modified":"2024-10-25T12:22:18","modified_gmt":"2024-10-25T12:22:18","slug":"bsi-pd-iec-tr-62361-1032018","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bsi-pd-iec-tr-62361-1032018\/","title":{"rendered":"BSI PD IEC\/TR 62361-103:2018"},"content":{"rendered":"
This part of IEC 62361, which is a technical report, describes the concepts of standard profiling for Common Information Model (CIM \u2013 IEC 61970, IEC 61968, IEC 62325) and IEC 61850 standard series. It serves as an introduction to profiling concepts and methodologies for the development of profiles for providing interoperability. It describes the specific needs and requirements of the standard application domains and derives profiling concepts respectively. Moreover the document defines the foundation for more detailed descriptions in the respective standard series.<\/p>\n
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2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
4<\/td>\n | CONTENTS <\/td>\n<\/tr>\n | ||||||
5<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 4 Profiling concepts 4.1 General 4.1.1 Overview <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 4.1.2 Framework for defining a profile 4.1.3 Framework for profiling Figures Figure 1 \u2013 Framework for defining a profile <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 4.1.4 Framework for testing profiles Figure 2 \u2013 Framework for profile <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 4.2 Constraints due to the technology used for defining profiles 4.3 Management of extensions to standards Figure 3 \u2013 Framework for testing profile <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 4.4 CIM profiling concept 4.4.1 General <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 4.4.2 CIM profile definition Figure 4 \u2013 Main steps for profiling CIM Figure 5 \u2013 Framework for profiling CIM <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 4.4.3 Requirements 4.4.4 Use cases for CIM profiles 4.4.5 Concept outline <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | 4.4.6 Profile development methodology 4.4.7 Profiling process <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | Figure 6 \u2013 Relation of contextual model artefacts <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | Figure 7 \u2013 Process of profiling CIM <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | 4.5 IEC 61850 profiling concept 4.5.1 General 4.5.2 IEC 61850 profile definition Figure 8 \u2013 Framework for profiling IEC 61850 <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | 4.5.3 IEC 61850 field or items which may be considered when profiling <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | 4.5.4 Requirements 4.5.5 Concept Outline <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | Figure 9 \u2013 Aggregating BAPs <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | 4.5.6 Profile related processes Figure 10 \u2013 Concept of BAPs and BAIOPs <\/td>\n<\/tr>\n | ||||||
26<\/td>\n | 4.6 CIM and IEC 61850 profiling comparison and common profiling rules Figure 11 \u2013 CIM and IEC 61850 profiling comparison <\/td>\n<\/tr>\n | ||||||
27<\/td>\n | Figure 12 \u2013 Potential similarities of profiling concepts <\/td>\n<\/tr>\n | ||||||
28<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Power systems management and associated information exchange. Interoperability in the long term – Standard profiling<\/b><\/p>\n |