| PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
|---|---|---|---|---|---|---|---|
| 9<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions 4 Symbols and abbreviations 1 Scope 2 Normative references 3 Terms and definitions 4 Symbols and abbreviations <\/td>\n<\/tr>\n | ||||||
| 10<\/td>\n | 5 Overview of sample analysis 5 Overview of sample analysis <\/td>\n<\/tr>\n | ||||||
| 12<\/td>\n | 6 Specimen characterization 6.1 General 6.2 Specimen forms 6.2.1 General 6 Specimen characterization 6.1 General 6.2 Specimen forms 6.2.1 General <\/td>\n<\/tr>\n | ||||||
| 13<\/td>\n | 6.2.2 Single crystal 6.2.3 Adsorbed or segregated layers, films and residues 6.2.4 Interfaces and multilayered samples 6.2.5 Non-porous 6.2.6 Porous 6.2.7 Powder 6.2.8 Fibres and textiles 6.2.9 Internal interface 6.2.2 Single crystal 6.2.3 Adsorbed or segregated layers, films and residues 6.2.4 Interfaces and multilayered samples 6.2.5 Non-porous 6.2.6 Porous 6.2.7 Powder 6.2.8 Fibres and textiles 6.2.9 Internal interface <\/td>\n<\/tr>\n | ||||||
| 14<\/td>\n | 6.3 Material types 6.3.1 General 6.3.2 Metals and alloys 6.3.3 Polymers 6.3.4 Semiconductors 6.3.5 Magnetic materials 6.3.6 Ceramics 6.3.7 Catalysts 6.3.8 Glass and insulators 6.3.9 Biological 6.3 Material types 6.3.1 General 6.3.2 Metals and alloys 6.3.3 Polymers 6.3.4 Semiconductors 6.3.5 Magnetic materials 6.3.6 Ceramics 6.3.7 Catalysts 6.3.8 Glass and insulators 6.3.9 Biological <\/td>\n<\/tr>\n | ||||||
| 15<\/td>\n | 6.4 Handling and mounting of specimens 6.5 Specimen treatments 6.5.1 General 6.5.2 Heating and cooling 6.5.3 Scraping and fracture 6.5.4 Ion bombardment for analysing thin films 6.5.5 Exposure to gases and liquids 7 Instrument characterization[8] 7.1 General 6.4 Handling and mounting of specimens 6.5 Specimen treatments 6.5.1 General 6.5.2 Heating and cooling 6.5.3 Scraping and fracture 6.5.4 Ion bombardment for analysing thin films 6.5.5 Exposure to gases and liquids 7 Instrument characterization[8] 7.1 General <\/td>\n<\/tr>\n | ||||||
| 16<\/td>\n | 7.2 Instrument checks 7.2.1 System health check[9] 7.2.2 Mechanical 7.2.3 Sample holder 7.2.4 Vacuum 7.3 Instrument calibration 7.3.1 Calibration of binding energy scale 7.2 Instrument checks 7.2.1 System health check[9] 7.2.2 Mechanical 7.2.3 Sample holder 7.2.4 Vacuum 7.3 Instrument calibration 7.3.1 Calibration of binding energy scale <\/td>\n<\/tr>\n | ||||||
| 18<\/td>\n | 7.3.2 Intensity repeatability and intensity\/energy response function (IERF) 7.3.2 Intensity repeatability and intensity\/energy response function (IERF) <\/td>\n<\/tr>\n | ||||||
| 19<\/td>\n | 7.3.3 Linearity of intensity scale test 7.3.3 Linearity of intensity scale test <\/td>\n<\/tr>\n | ||||||
| 20<\/td>\n | 7.3.4 Lateral resolution 7.3.5 Depth resolution[21][22] 7.3.4 Lateral resolution 7.3.5 Depth resolution[21][22] <\/td>\n<\/tr>\n | ||||||
| 22<\/td>\n | 7.3.6 Charge correction 7.4 Instrument set-up 7.4.1 Optimum settings 7.3.6 Charge correction 7.4 Instrument set-up 7.4.1 Optimum settings <\/td>\n<\/tr>\n | ||||||
| 23<\/td>\n | 7.4.2 System configuration 8 The wide-scan spectrum 8.1 Data acquisition 8.1.1 General 8.1.2 Energy resolution 8.1.3 Energy range, step size and acquisition mode 8.1.4 Charge correction 7.4.2 System configuration 8 The wide-scan spectrum 8.1 Data acquisition 8.1.1 General 8.1.2 Energy resolution 8.1.3 Energy range, step size and acquisition mode 8.1.4 Charge correction <\/td>\n<\/tr>\n | ||||||
| 24<\/td>\n | 8.2 Data analysis 8.2.1 Peak identification and labelling 8.2 Data analysis 8.2.1 Peak identification and labelling <\/td>\n<\/tr>\n | ||||||
| 25<\/td>\n | 8.2.2 Peak intensity 8.2.3 Element-specific data 8.2.4 Assessment and utilization of peak intensities[34] 8.2.5 Assessment and utilization of background[35] 8.2.6 Assessment of wide-scan spectrum 8.2.2 Peak intensity 8.2.3 Element-specific data 8.2.4 Assessment and utilization of peak intensities[34] 8.2.5 Assessment and utilization of background[35] 8.2.6 Assessment of wide-scan spectrum <\/td>\n<\/tr>\n | ||||||
| 26<\/td>\n | 9 The narrow scan 9.1 General 9.2 Data acquisition 9.2.1 Instrument settings 9.2.2 Choice of region 9.3 Data analysis 9.3.1 Element identification 9.3.2 Chemical-state identification 9.3.2.1 Methods of identifying chemical state[44] 9 The narrow scan 9.1 General 9.2 Data acquisition 9.2.1 Instrument settings 9.2.2 Choice of region 9.3 Data analysis 9.3.1 Element identification 9.3.2 Chemical-state identification 9.3.2.1 Methods of identifying chemical state[44] <\/td>\n<\/tr>\n | ||||||
| 27<\/td>\n | 9.3.2.2 Assessment of compositional inhomogeneities in the sample[34] 9.3.2.3 Estimation and assessment of trial sample composition 9.3.2.4 Consideration of possibility of multiple compounds in sample 9.3.3 Quantification 9.3.3.1 Measurement of peak intensities[34] 9.3.2.2 Assessment of compositional inhomogeneities in the sample[34] 9.3.2.3 Estimation and assessment of trial sample composition 9.3.2.4 Consideration of possibility of multiple compounds in sample 9.3.3 Quantification 9.3.3.1 Measurement of peak intensities[34] <\/td>\n<\/tr>\n | ||||||
| 28<\/td>\n | 9.3.3.2 Measurement of composition for an identified phase (homogeneous sample) 9.3.3.3 Measurement of composition as a function of depth 9.3.3.2 Measurement of composition for an identified phase (homogeneous sample) 9.3.3.3 Measurement of composition as a function of depth <\/td>\n<\/tr>\n | ||||||
| 29<\/td>\n | 9.3.3.4 Measurement of overlayer-film thickness 9.3.3.4 Measurement of overlayer-film thickness <\/td>\n<\/tr>\n | ||||||
| 30<\/td>\n | 9.3.3.5 Measurement of composition as a function of lateral position on the sample 10 Test report 9.3.3.5 Measurement of composition as a function of lateral position on the sample 10 Test report <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis<\/b><\/p>\n |