{"id":81232,"date":"2024-10-17T18:52:39","date_gmt":"2024-10-17T18:52:39","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-167a-1-1995\/"},"modified":"2024-10-24T19:46:05","modified_gmt":"2024-10-24T19:46:05","slug":"ieee-167a-1-1995","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-167a-1-1995\/","title":{"rendered":"IEEE 167A.1 1995"},"content":{"rendered":"

Revision Standard – Inactive – Withdrawn. A facsimile test chart for assessing performance of document facsimile systems, including any compatible combination of facsimile equipment, computers, transmission facilities, and image storage, is provided. The chart is composed solely of high-resolution, high contrast black-and-white patterns. Although the chart is designed for Group 3 and Group 4 facsimile, it is also expected to be useful in testing other imaging systems. The received image may be recorded or displayed. This standard offers a means of assessing various technical quality parameters, detecting defects produced in received images, and evaluating the readability of text when the original is black and white.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
5<\/td>\n1 Overview
1.1 Scope
1.2 Purpose
Test chart description
Pattern 1-ITU-T border of 4 scales with inch and millimeter markings <\/td>\n<\/tr>\n
7<\/td>\nPattern 2-Black bar across full page width and a scale in inches across the top
Pattern 3-Four patterns of truncated fan-type multiple-line pattern with low taper rate
white lines per inch
Pattern 5-Alternating black-and-white lines
Pattern &Black-and-white bar patterns
Pattern 7-Isolated black and white lines calibrated in micrometers
Pattern 8-NIST type resolution pattern
micrometers or inches
Pattern 10-Black-white bar pattern of 5 black plus white bars per inch
Pattern 1 1-Parallel lines inclined at 5 degrees from vertical
Pattern 12-NIST type resolution pattern <\/td>\n<\/tr>\n
8<\/td>\nPattern 13-Diagonal line for checking irregularities in vertical pitch
Pattern 15-Halftone dot screens of 10 50 and 90 percent black
Pattern 16-Line crossing pattern
Pattern 17-Text in English Arabic Chinese Russian Spanish and French <\/td>\n<\/tr>\n
9<\/td>\nAnnex A (informative) Guidelines for use <\/td>\n<\/tr>\n
12<\/td>\nAnnex B (informative) Bibligraphy <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

IEEE Standard Facsimile Test Chart: Bi-level (Black & White)<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
IEEE<\/b><\/a><\/td>\n1995<\/td>\n13<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":81233,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2644],"product_tag":[],"class_list":{"0":"post-81232","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-ieee","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/81232","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/81233"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=81232"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=81232"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=81232"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}